Low Leakage and Robust Sub-threshold SRAM Cell Using Memristor

被引:0
|
作者
Mustaqueem, Zeba [1 ]
Ansari, Abdul Quaiyum [1 ]
Akram, Md Waseem [1 ]
机构
[1] Jamia Milia Islamia Cent Univ, New Delhi, India
关键词
-6T SRAM cell; memristor; power dissipation; read and write operation; leakage current; stability; non-volatile circuit; DESIGN;
D O I
10.24425/ijet.2022.141287
中图分类号
TN [电子技术、通信技术];
学科分类号
0809 ;
摘要
work aims to improve the total power dissipation, leakage currents and stability without disturbing the logic state of SRAM cell with concept called sub-threshold operation. Though, sub-threshold SRAM proves to be advantageous but fails with basic 6T SRAM cell during readability and writability. In this paper we have investigated a non-volatile 6T2M (6 Transistors & 2 Memristors) sub-threshold SRAM cell working at lower supply voltage of VDD=0.3V, where Memristor is used to store the information even at power failures and restores previous data with successful read and write operation overcomes the challenge faced. This paper also proposes a new configuration of non-volatile 6T2M (6 Transistors & 2 Memristors) sub-threshold SRAM cell resulting in improved behaviour in terms of power, stability and leakage current where read and write power has improved by 40% and 90% respectively when compared to 6T2M (conventional) SRAM cell. The proposed 6T2M SRAM cell offers good stability of RSNM=65mV and WSNM=93mV which is much improved at low voltage when compared to conventional basic 6T SRAM cell, and improved leakage current of 4.92nA is achieved as compared.
引用
收藏
页码:667 / 676
页数:10
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