Embedded test technique extends 1149.1 boundary-scan architecture

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作者：
Desposito, J
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ELECTRONIC DESIGN | 1999年 / 47卷 / 24期
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码：50 / 50
页数：1
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