Anomalous birefringence of light in free-standing samples of porous silicon

被引：20
|
作者：
Kompan, ME [1 ]
Salonen, J
Shabanov, IY
机构：
[1] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 194021, Russia
[2] Univ Turku, SF-20500 Turku, Finland
来源：
JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS | 2000年 / 90卷 / 02期
关键词：
Spectroscopy; Silicon; Anisotropy; Field Theory; Elementary Particle;
D O I：
10.1134/1.559107
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The birefringence of light in freely suspended samples of porous silicon is observed and investigated. The effect is interpreted as "shape birefringence," i.e., the effect caused by the structure of a material consisting of anisotropic formations with sizes less than the wavelength of the light and with a predominant orientation. It is checked experimentally that the samples do not possess optical activity or optical anisotropy in the plane of the porous-silicon film. It is determined that the effect is observed for polarization of incident light that rules out the possibility of observing birefringence in a uniform optical medium, and it is not observed in the conventional experimental geometry. Qualitative explanations are given for the anomalous character of the observed defect. (C) 2000 MAIK "Nauka /Interperiodica".
引用
收藏
页码：324 / 329
页数：6
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