Nonlinear optical refraction of free-standing porous silicon layers

被引：3
|
作者：
Lettieri, S. [1 ]
Fiore, O. [1 ]
Maddalena, P. [1 ]
Ninno, D. [1 ]
Di Francia, G. [2 ]
La Ferrara, V. [2 ]
机构：
[1] INFM and Dipto. di Scienze Fisiche, Univ. Napoli federico II, C., Napoli, Italy
[2] ENEA-CRIF Ctro. Ric. Fotovoltaiche, Localita Granatello, I-80055, P., Napoli, Italy
来源：
Optics Communications | 1999年 / 168卷 / 05期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：383 / 391
相关论文
共 50 条
  • [1] Nonlinear optical refraction of free-standing porous silicon layers
    Lettieri, S
    Fiore, O
    Maddalena, P
    Ninno, D
    Di Francia, G
    La Ferrara, V
    OPTICS COMMUNICATIONS, 1999, 168 (5-6) : 383 - 391
  • [2] Free-Standing Luminescent Layers of Porous Silicon
    Goryachev, D. N.
    Belyakov, L. V.
    Sreseli, O. M.
    SEMICONDUCTORS, 2010, 44 (12) : 1588 - 1591
  • [3] Free-standing luminescent layers of porous silicon
    D. N. Goryachev
    L. V. Belyakov
    O. M. Sreseli
    Semiconductors, 2010, 44 : 1588 - 1591
  • [4] The effect of deuterium on the optical properties of free-standing porous silicon layers
    Matsumoto, T
    Belogorokhov, AI
    Belogorokhova, LI
    Masumoto, Y
    Zhukov, EA
    NANOTECHNOLOGY, 2000, 11 (04) : 340 - 347
  • [5] Electrical behavior of free-standing porous silicon layers
    Bazrafkan, I.
    Dariani, R. S.
    PHYSICA B-CONDENSED MATTER, 2009, 404 (12-13) : 1638 - 1642
  • [6] Measurements of the nonlinear refractive index of free-standing porous silicon layers at different wavelengths
    2001, Taylor and Francis Inc. (81):
  • [7] Optical hysteresis in free-standing porous silicon films
    Cojocaru, I
    Pasat, V
    Karavanskii, V
    Chumash, V
    JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2001, 3 (01): : 133 - 135
  • [8] Optical Characterization of Free-Standing Porous Silicon Films
    S. Guha
    Peter Steiner
    F. Kozlowski
    W. Lang
    Journal of Porous Materials, 1997, 4 : 227 - 237
  • [9] Optical limiting in free-standing porous silicon films
    Center of Optoelectronics, Inst. Appl. Phys. Acad. of Sci., Academiei St. 1, Chishinau, MD-2028, Moldova
    不详
    J. Optoelectron. Adv. Mat., 2 (67-69):
  • [10] Optical Characterization of Free-Standing Porous Silicon Films
    Guha, S.
    Steiner, Peter
    Kozlowski, F.
    Lang, W.
    JOURNAL OF POROUS MATERIALS, 1997, 4 (04) : 227 - 237
12345