Practical Simulation Flow for Evaluating Analog/Mixed-Signal Test Techniques

被引：16

作者：

Barragan, Manuel J. ^{[1
]}

Stratigopoulos, Haralampos-G. ^{[2
]}

Mir, Salvador ^{[1
]}

Le-Gall, Herve ^{[3
]}

Bhargava, Neha ^{[4
]}

Bal, Ankur ^{[4
]}

机构：

[1] Univ Grenoble Alpes, CNRS, TIMA, Grenoble, France

[2] UPMC Univ Paris 06, Sorbonne Univ, CNRS, LIP6, F-75252 Paris 05, France

[3] STMicroelectronics, Grenoble, France

[4] STMicroelectronics, Noida, India

来源：

IEEE DESIGN & TEST | 2016年 / 33卷 / 06期

关键词：

PARAMETRIC TEST METRICS;

D O I：

10.1109/MDAT.2016.2590985

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Accurate and efficient evaluation of alternative test methods is required for analog/mixed-signal circuits. To address this need, this article presents a semiautomated practical simulation flow specifically targeting circuits with long simulation times. © 2016 IEEE.

引用

页码：46 / 54

页数：9

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