Interferometric Technique for Scanning Near-field Microwave Microscopy Applications

被引：0
|
作者：
Bakli, H.
Haddadi, K.
Lasri, T.
机构：
来源：
2013 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) | 2013年
关键词：
Interferometry; near-field scanning microwave microscopy; non-destructive testing and evaluation; RESOLUTION;
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
An interferometric technique for scanning near-field microscopy applications is proposed. The method is based on the association of a vector network analyzer, an evanescent microwave coaxial probe and a precise interferometer built up with a power divider, a phase-shifter and an attenuator. Advantages such as simplicity of operation, broad frequency band capabilities and high measurement sensitivity are achieved. In particular, a scanning near-field microwave microscope is built and experiments related to the measurement sensitivity in the frequency range 2-6 GHz are demonstrated.
引用
收藏
页码：1694 / 1698
页数：5
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