PHOTOTHERMAL SCANNING NEAR-FIELD MICROSCOPY

被引：15
|
作者：
STOPKA, M
OESTERSCHULZE, E
SCHULTE, J
KASSING, R
机构：
[1] Institute of Technical Physics, University of Kassel, 34109 Kassel
来源：
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1994年 / 24卷 / 1-3期
关键词：
D O I：
10.1016/0921-5107(94)90333-6
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Two types of photothermal measurement technique will be presented, which might allow the high spatially resolved investigation of thermal properties of substrates and thin films. Both methods employ measurement techniques which are based on scanning near-field microscopy. In the first case we show initial experimental results of periodic thermal expansion measurements of a laser excited sample surface using a scanning tunneling microscope. In the second case we present the principle of a scanning thermal microscope, which measures the temperature distribution above the sample surface.
引用
收藏
页码：226 / 228
页数：3
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