Photoelectron emission microscopy and its application to the study of polymer surfaces

被引：4
|
作者：
CossyFavre, A [1 ]
Diaz, J [1 ]
Anders, S [1 ]
Padmore, H [1 ]
Liu, Y [1 ]
Samant, M [1 ]
Stohr, J [1 ]
Brown, H [1 ]
Russell, TP [1 ]
机构：
[1] IBM CORP,ALMADEN RES CTR,SAN JOSE,CA 95120
来源：
ACTA PHYSICA POLONICA A | 1997年 / 91卷 / 05期
关键词：
D O I：
10.12693/APhysPolA.91.923
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The X-ray photoelectron emission microscopy at the Advanced Light Source has a spatial resolution of 0.2 microns at an accelerating voltage of 12 kV. The tunability of the photon energy is used to provide chemical state information using near edge X-ray absorption fine structure spectroscopy on the sub-micrometer scale. The homogeneity of thin films of polymer blends was studied for various film thicknesses. The polystyrene/polyvinylmethylether film of 194 Angstrom showed protrusions of 2-3 mu m diameter with an enriched polystyrene content while the polystyrene/polystyreneacrylonitrile 504 Angstrom thick films showed 5-6 mu m segregated regions without any topological structure.
引用
收藏
页码：923 / 927
页数：5
相关论文
共 50 条
  • [31] MONOCHROMATIZATION OF ELECTRON BEAMS BY REFLECTION AND ITS APPLICATION TO EMISSION MICROSCOPY
    GRUNER, H
    GAUKLER, KH
    MOLLENSTEDT, G
    OPTIK, 1971, 33 (03): : 255 - +
  • [32] APPLICATION OF PHOTOELECTRON-SPECTROSCOPY TO STUDY OF EP FILMS ON LUBRICATED SURFACES
    BIRD, RJ
    GALVIN, GD
    WEAR, 1976, 37 (01) : 143 - 167
  • [33] Detection of tribochemical reactions using photoelectron emission microscopy
    Montei, EL
    Kordesch, ME
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1996, 14 (03): : 1352 - 1356
  • [34] Probing organic nanostructures by photoelectron-emission microscopy
    Wagner, Thorsten
    Fritz, Daniel Roman
    Zeppenfeld, Peter
    APPLIED SURFACE SCIENCE, 2013, 267 : 26 - 29
  • [35] Photoelectron emission microscopy of ultrathin oxide covered devices
    Ballarotto, VW
    Breban, M
    Siegrist, K
    Phaneuf, RJ
    Williams, ED
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2002, 20 (06): : 2514 - 2518
  • [36] Scanning force microscopy application to polymer surfaces for novel nanoscale surface characterization
    Motomatsu, M
    Nie, HY
    Mizutani, W
    Tokumoto, H
    THIN SOLID FILMS, 1996, 273 (1-2) : 304 - 307
  • [37] Time-resolved photoelectron emission from surfaces
    Lemell, C.
    Tokesi, K.
    Burgdoerfer, J.
    XXVII INTERNATIONAL CONFERENCE ON PHOTONIC, ELECTRONIC AND ATOMIC COLLISIONS (ICPEAC 2011), PTS 1-15, 2012, 388
  • [38] Laser Photoelectron Projection Microscopy of an Organic Conducting Polymer
    Mironov, B. N.
    Aseev, S. A.
    Chekalin, S. V.
    Ivanov, V. F.
    Gribkova, O. L.
    JETP LETTERS, 2010, 92 (11) : 779 - 782
  • [39] PHOTOELECTRON EMISSION FROM ALKALI-HALIDE SURFACES
    POOLE, RT
    JENKIN, JG
    LECKEY, RCG
    LIESEGANG, J
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, : 771 - 774
  • [40] Laser photoelectron projection microscopy of an organic conducting polymer
    B. N. Mironov
    S. A. Aseev
    S. V. Chekalin
    V. F. Ivanov
    O. L. Gribkova
    JETP Letters, 2010, 92 : 779 - 782
12345