Random telegraph signals and noise behaviors in carbon nanotube transistors

被引:12
|
作者
Liu, Fei
Wang, Kang L.
Zhang, Daihua
Zhou, Chongwu
机构
[1] Univ Calif Los Angeles, Device Res Lab, Dept Elect Engn, Los Angeles, CA 90095 USA
[2] Univ So Calif, Dept Elect Engn, Los Angeles, CA 90089 USA
关键词
u;
D O I
10.1063/1.2402224
中图分类号
O59 [应用物理学];
学科分类号
摘要
A random telegraph signal appears at a smaller absolute gate bias for a larger absolute drain-source bias in a carbon nanotube transistor. Its mechanism is attributed to a defect located in the drain side of the Schottky barrier carbon nanotube transistor with Ti/Au as contact material. Furthermore, room temperature random telegraph signal is presented for both semiconducting and metallic carbon nanotubes, indicating the need to include random telegraph signal as a noise source for carbon nanotube transistors. (c) 2006 American Institute of Physics.
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页数:3
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