Silicon Carbide on Silicon (110): Surface Structure and Mechanisms of Epitaxial Growth

被引:4
|
作者
Sambonsuge, S. [1 ]
Nikitina, L. N. [2 ]
Hervieu, Yu. Yu. [3 ]
Suemitsu, M. [1 ]
Filimonov, S. N. [3 ]
机构
[1] Tohoku Univ, Sendai, Miyagi 980, Japan
[2] Natl Res Tomsk Polytech Univ, Tomsk, Russia
[3] Natl Res Tomsk State Univ, Tomsk, Russia
基金
日本学术振兴会; 俄罗斯基础研究基金会;
关键词
silicon carbide; silicon; heteroepitaxy; surface structure; surface energy; CHEMICAL-VAPOR-DEPOSITION; 100; SI; MONOMETHYLSILANE;
D O I
10.1007/s11182-014-0197-7
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Results of investigations of the SiC/Si growth from monomethylsilane are reported. Growth conditions favoring the rotated epitaxy of 3C-SiC(111) films on Si(110) are determined experimentally. Surface energies of clean and hydrogen covered 3C-SiC(110) and 3C-SiC(111) surfaces are calculated with the density functional theory approach. It is shown that the change of the 3C-SiC film orientation with decreasing surface temperature and increasing monomethylsilane pressure may be induced by a reduction of the surface energy anisotropy due to the surface passivation by hydrogen.
引用
收藏
页码:1439 / 1444
页数:6
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