ADVANCES IN X-RAY SOURCE TECHNOLOGY FOR DIFFRACTION APPLICATIONS

被引:0
|
作者
Thorson, T. A. [1 ]
Durst, R. D. [1 ]
Foundling, S. I. [1 ]
Kerpershoek, G. J. [2 ]
Storm, A. B. [2 ]
机构
[1] Bruker AXS Inc, Billerica, MA USA
[2] Bruker Nonius BV, Delaware, OH USA
来源
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2002年 / 58卷
关键词
X-RAY SOURCE; ROTATING ANODE GENERATOR; SEALED TUBE GENERATOR;
D O I
10.1107/S0108767302087792
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
收藏
页码:C69 / C69
页数:1
相关论文
共 50 条
  • [11] SYNCHROTRON RADIATION AS A SOURCE FOR X-RAY DIFFRACTION
    ROSENBAU.G
    HOLMES, KC
    WITZ, J
    NATURE, 1971, 230 (5294) : 434 - &
  • [12] Characteristics of a molybdenum X-pinch X-ray source as a probe source for X-ray diffraction studies
    Zucchini, F.
    Bland, S. N.
    Chauvin, C.
    Combes, P.
    Sol, D.
    Loyen, A.
    Roques, B.
    Grunenwald, J.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2015, 86 (03):
  • [13] XMEMS: dynamic diffraction gratings by MEMS technology for X-ray imaging applications
    Gorelick, Sergey
    26TH EUROPEAN CONFERENCE ON SOLID-STATE TRANSDUCERS, EUROSENSOR 2012, 2012, 47 : 277 - 280
  • [14] Applications of micropinch x-ray source
    Semyonov, OG
    Gurey, AE
    Kanavin, AP
    Tikhomirov, AA
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (04): : 1235 - 1240
  • [15] Advances in array detectors for X-ray diffraction techniques
    Hanley, QS
    Denton, MB
    JOURNAL OF SYNCHROTRON RADIATION, 2005, 12 : 618 - 625
  • [16] RECENT ADVANCES IN X-RAY DETECTION TECHNOLOGY
    AITKEN, DW
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1968, NS15 (03) : 10 - +
  • [17] APPLICATIONS OF X-RAY DIFFRACTION IN PAINT INDUSTRY
    SCOTT, RW
    JOURNAL OF PAINT TECHNOLOGY, 1969, 41 (534): : 422 - &
  • [18] Multivariate Analysis Applications in X-ray Diffraction
    Guccione, Pietro
    Lopresti, Mattia
    Milanesio, Marco
    Caliandro, Rocco
    CRYSTALS, 2021, 11 (01) : 1 - 21
  • [19] DSC And X-Ray Diffraction CouplingSpecifications and applications
    G. Keller
    F. Lavigne
    L. Forte
    K. Andrieux
    M. Dahim
    C. Loisel
    M. Ollivon
    C. Bourgaux
    P. Lesieur
    Journal of Thermal Analysis and Calorimetry, 1998, 51 : 783 - 791
  • [20] Applications of X-Ray Diffraction in the Pharmaceutical Industry
    Fischer, Andreas
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2007, 63 : S52 - S52