A repeater optimization methodology for deep sub-micron, high performance processors

被引:18
|
作者
Li, D
Pua, A
Srivastava, P
Ko, U
机构
关键词
D O I
10.1109/ICCD.1997.628945
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
As the process technology scales down to deep sub-micron and frequency of a high-performance processor increases beyond 300 MHz, coupling induced signal integrity problems become more severe. Ignoring coupling effects can lead to functional failures or speed degradation. As a result, the traditional approach of repeater insertion driven by propagation delay and slew rate optimization becomes inadequate. In this paper, we propose a design methodology to select optimal repeaters for high-performance processors by considering not only the delay and slew rate, but also crosstalk effects. A Concurrent Decision Diagram (CDD) is further suggested to achieve crosstalk constraints with various trade-offs.
引用
收藏
页码:726 / 731
页数:6
相关论文
共 50 条
  • [21] Designing high performance cost-efficient embedded sram in deep sub-micron era
    Kobozeva, O
    Venkatraman, R
    Castagnetti, R
    Duan, F
    Kamath, A
    Ramesh, S
    DESIGN AND PROCESS INTEGRATION FOR MICROELECTRONIC MANUFACTURING II, 2004, 5379 : 241 - 252
  • [22] Dielectric Integration for Sub-Micron High Performance Integrated Circuits
    Wei William Lee Texas Instruments Inc North Central Expressway MS Dallas TX wlee spdc ti Com
    微电子技术, 1999, (03) : 41 - 47
  • [23] Test challenges for deep sub-micron technologies
    Cheng, KT
    Dey, S
    Rodgers, M
    Roy, K
    37TH DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2000, 2000, : 142 - 149
  • [24] SUB-MICRON LITHOGRAPHY WITH HIGH-PERFORMANCE PROJECTION OPTICS
    ARDEN, W
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (08) : C325 - C325
  • [25] Deep sub-micron signal integrity challenge
    Kirkpatrick, Desmond A.
    Proceedings of the International Symposium on Physical Design, 1999, : 4 - 7
  • [26] SUB-MICRON RESOLUTION DEEP UV PHOTOLITHOGRAPHY
    VOSHCHENKOV, AM
    HERRMANN, H
    ELECTRONICS LETTERS, 1981, 17 (02) : 61 - 62
  • [27] Deep sub-micron bus invert coding
    Lindkvist, T
    Löfvenberg, J
    Gustafsson, O
    NORSIG 2004: PROCEEDINGS OF THE 6TH NORDIC SIGNAL PROCESSING SYMPOSIUM, 2004, 46 : 133 - 136
  • [28] Deep sub-micron gate diamond MISFETs
    Matsudaira, H
    Takuya, A
    Umezawa, H
    Miyamoto, S
    Ishizaka, H
    Tachiki, M
    Kawarada, H
    DIAMOND AND RELATED MATERIALS, 2003, 12 (10-11) : 1814 - 1818
  • [29] Systematic defects in deep sub-micron technologies
    Kruseman, B
    Majhi, A
    Hora, C
    Eichenberger, S
    Meirlevede, J
    INTERNATIONAL TEST CONFERENCE 2004, PROCEEDINGS, 2004, : 290 - 299
  • [30] FANTCAD: ATPG for the deep sub-micron era
    Fujitsu Ltd, Kawasaki, Japan
    Fujitsu Sci Tech J, 2 (167-172):