7th Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods - TXRF '98, Austin, TX, USA - Preface

被引：0

|

作者：

Zaitz, MA

Wobrauschek, P

机构：

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1999年 / 54卷 / 10期

关键词：

D O I：

暂无

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

收藏

页码：1383 / 1384

页数：2

相关论文

共 50 条

[31] Quantitative determination of cadmium in polyethylene using total reflection X-ray fluorescence (TXRF) spectroscopy
Simmross, U
Fischer, R
Duwel, F
Muller, U
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1997, 358 (04): : 541 - 545
[32] Quantitative determination of cadmium in polyethylene using total reflection X-ray fluorescence (TXRF) spectroscopy
U. Simmross
R. Fischer
F. Düwel
U. Müller
Fresenius' Journal of Analytical Chemistry, 1997, 358 : 541 - 545
[33] 6th Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods (TXRF '96). June 10-11, 1996, Eindhoven, Holland and June 13-14, 1996, Dortmund, Germany
Beaven, P
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 1996, 11 (10) : N41 - N42
[34] Special Issue A Selection of Papers Presented at the 13th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods, Goteborg, Sweden, 15-19 June 2009 Preface
Boman, Johan
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2010, 65 (06) : 427 - 428
[35] Special issue - 9th Symposium on Total Reflection X-ray Analysis and Related Methods
de Carvalho, ML
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2003, 58 (12) : 2023 - 2024
[36] APPLICATION OF X-RAY-FLUORESCENCE ANALYSIS WITH TOTAL-REFLECTION (TXRF) IN MATERIAL SCIENCE
HEIN, M
HOFFMANN, P
LIESER, KH
ORTNER, HM
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1992, 343 (9-10): : 760 - 764
[37] Chemical Analysis of CsPbBr2X (X = Cl, I) Nanocomposites by Total Reflection X-Ray Fluorescence Spectroscopy (TXRF)
Filatova, D. G.
Chizhov, A. S.
Rumyantseva, M. N.
INORGANIC MATERIALS, 2023, 59 (14) : 1414 - 1417
[38] MULTIELEMENT ANALYSIS OF STANDARD REFERENCE MATERIALS WITH TOTAL REFLECTION X-RAY-FLUORESCENCE (TXRF)
GERWINSKI, W
GOETZ, D
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1987, 327 (07): : 690 - 693
[39] Chemical Analysis of CsPbBr2X (X = Cl, I) Nanocomposites by Total Reflection X-Ray Fluorescence Spectroscopy (TXRF)
D. G. Filatova
A. S. Chizhov
M. N. Rumyantseva
Inorganic Materials, 2023, 59 : 1414 - 1417
[40] Variations of X-ray spectrum in total reflection X-ray fluorescence (TXRF) analysis with respect to Si wafer crystal orientation for different incident angles
Liou, BW
Lee, CL
CHINESE JOURNAL OF PHYSICS, 1999, 37 (06) : 623 - 630

← 1 2 3 4 5 →