Special Issue A Selection of Papers Presented at the 13th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods, Goteborg, Sweden, 15-19 June 2009 Preface

被引:0
|
作者
Boman, Johan [1 ]
机构
[1] Univ Gothenburg, Dept Chem, SE-41296 Gothenburg, Sweden
关键词
D O I
10.1016/j.sab.2010.05.001
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
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页码:427 / 428
页数:2
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