Reliability evaluation for the mechanical switch using an accelerated life test

被引:0
|
作者
Park, Sang-Jun [1 ]
Park, Sano-Deuk [1 ]
Lee, Se-Hyun [1 ]
Han, Kil-Sung [1 ]
机构
[1] Samsung Elect, CS Management Ctr, Suwon, South Korea
关键词
accelerated testing; acceleration factor; Weibull distribution; mechanical switch;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A mechanical switch assembly is used to power on a color display tube (CDT) monitor. This research was aimed to develop an accelerated test as to demonstrate a reliability goal of the mechanical switch within an affordable amount of time and in an economic way. They were evaluated under step stress margin tests first in order to verify their operating limit in certain mechanical stress and then an accelerated test (AT) was conducted to measure the annual failure rate and B, life of the assembly. The push force while power on and off was used as stress factor to accelerate the failure of it. The value of the acceleration factor was estimated by 34.4 at the high stress condition compared to the use condition. It also showed that all 5 units must survive for 1,500 cycles at the stress condition 9.3kgf to assure B, = 10 years of the assembly at the use condition in 90% confidence level.
引用
收藏
页码:194 / 197
页数:4
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