Reliability evaluation for the mechanical switch using an accelerated life test

被引:0
|
作者
Park, Sang-Jun [1 ]
Park, Sano-Deuk [1 ]
Lee, Se-Hyun [1 ]
Han, Kil-Sung [1 ]
机构
[1] Samsung Elect, CS Management Ctr, Suwon, South Korea
关键词
accelerated testing; acceleration factor; Weibull distribution; mechanical switch;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A mechanical switch assembly is used to power on a color display tube (CDT) monitor. This research was aimed to develop an accelerated test as to demonstrate a reliability goal of the mechanical switch within an affordable amount of time and in an economic way. They were evaluated under step stress margin tests first in order to verify their operating limit in certain mechanical stress and then an accelerated test (AT) was conducted to measure the annual failure rate and B, life of the assembly. The push force while power on and off was used as stress factor to accelerate the failure of it. The value of the acceleration factor was estimated by 34.4 at the high stress condition compared to the use condition. It also showed that all 5 units must survive for 1,500 cycles at the stress condition 9.3kgf to assure B, = 10 years of the assembly at the use condition in 90% confidence level.
引用
收藏
页码:194 / 197
页数:4
相关论文
共 50 条
  • [31] Development of an Accelerated Life Test Method Using the Conversion of Thermal Shock Stress to Mechanical Stress
    Choi, Hyoung-Seuk
    Choi, Duck-Kyun
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2016, 16 (11) : 11359 - 11363
  • [32] Research on Reliability Assessment of Space Electronic Products Based on Integration of Highly Accelerated Life Test and Accelerated Degradation Test
    Liu, Kai
    Lv, Congmin
    Dang, Wei
    Li, Lingjiang
    Zou, Tianji
    Li, Peng
    2016 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL ENGINEERING AND ENGINEERING MANAGEMENT (IEEM), 2016, : 1651 - 1654
  • [33] Reliability prediction of multilayer ceramic capacitors using an improved accelerated life test and Weibull analysis technique
    Pak, H
    Rawal, B
    1997 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, PROCEEDINGS, 1997, 3235 : 362 - 367
  • [34] Time-Dependent Reliability Evaluation Method of Harmonic Drive with Transient Finite Element and Accelerated Life Test
    Zhang X.
    Jiang G.
    Mei X.
    Zhang H.
    Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University, 2020, 54 (04): : 1 - 9
  • [35] Confidence reliability evaluation model of dual constant-stress accelerated life test for Weibull distribution product
    Liang H.
    Feng X.
    Tang J.
    Liu Q.
    Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics, 2020, 42 (09): : 2140 - 2148
  • [36] Reliability Evaluation of Air Dryer Control Printed Circuit Board for Electric Multiple Unit by Accelerated Life Test
    Kang, Gil Hyun
    Kim, Kyung Sik
    Chang, Chin Young
    Kim, Chul Su
    JOURNAL OF ELECTRICAL ENGINEERING & TECHNOLOGY, 2023, 19 (01) : 821 - 830
  • [37] Reliability Evaluation of Air Dryer Control Printed Circuit Board for Electric Multiple Unit by Accelerated Life Test
    Gil Hyun Kang
    Kyung Sik Kim
    Chin Young Chang
    Chul Su Kim
    Journal of Electrical Engineering & Technology, 2024, 19 : 821 - 830
  • [38] Accelerated reliability test results: Importance of input vibration spectrum and mechanical response of test article
    Jawaid, S
    Rogers, P
    ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM - 2000 PROCEEDINGS, 2000, : 248 - 253
  • [39] Research on Accelerated Degradation Test and Reliability Evaluation Method of Electromechanical Products
    Wang, Yi
    PROCEEDINGS OF THE 33RD CHINESE CONTROL AND DECISION CONFERENCE (CCDC 2021), 2021, : 482 - 487
  • [40] Reliability assessment of mica high voltage capacitor through environmental test and accelerated life test
    Park, Seong Hwan
    Ham, Young Jae
    Kim, Jeong Seok
    Kim, Kyoung Hun
    So, Seong Min
    Jeon, Min Seok
    JOURNAL OF THE KOREAN CRYSTAL GROWTH AND CRYSTAL TECHNOLOGY, 2019, 29 (06): : 270 - 275