Drain Current Modelling of Asymmetric Junctionless Dual Material Double Gate MOSFET with High K Gate Stack for Analog and RF Performance

This paper presents the continuous 2D analytical modelling of electrostatic potential, threshold voltage (V-th), subthreshold swing, drain induced barrier lowering (DIBL) and drain current of asymmetric junctionless dual material double gate MOSFET with high K gate stack (AJDMDG Stack MOSFET). The electrostatic potential is achieved by solving Poisson's equation with the help of the parabolic approximation method. Analytical results are verified by using ATLAS TCAD Device simulator. A comparative study of short channel effects (SCEs) of AJDMDG Stack MOSFET and asymmetric junctionless dual material double gate MOSFET with high K gate stack (SJDMDG Stack MOSFET) has been observed in order to show the efficacy of asymmetry condition such as gate oxide asymmetry, gate work function asymmetry etc. for suppressing SCEs. Further, analog/RF performance parameters such as transconductance (g(m)), output resistance (r(out)), intrinsic gain, transconductance generation factor (TGF), cut-off frequency (f(T)), maximum frequency (f(max)), gain bandwidth product (GBW) etc. of AJDMDG Stack MOSFET are observed and compared the results with SJDMDG Stack MOSFET structure. Results reveal that AJDMDG Stack MOSFET has better efficacy for RF applications.