Verifying DiffEXAFS measurements with differential X-ray diffraction

被引：5

作者：

Ruffoni, M. P. ^{[1
]}

Pettifer, R. F.

Pascarelli, S.

Mathon, O.

机构：

[1] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England

[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2007年 / 14卷

关键词：

DiffXRD; DiffEXAFS; atomic strain; thermal expansion; strontium fluoride;

D O I：

10.1107/S0909049506049971

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Differential EXAFS (DiffEXAFS) is a novel technique for measuring atomic perturbations on a local scale. Here a complementary technique for such studies is presented: differential X-ray diffraction (DiffXRD), which may be used to independently verify DiffEXAFS results whilst using exactly the same experimental apparatus and measurement technique. A test experiment has been conducted to show that DiffXRD can be used to successfully determine the thermal expansion coefficient of SrF2.

引用

页码：169 / 172

页数：4

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