Verifying DiffEXAFS measurements with differential X-ray diffraction

被引:5
|
作者
Ruffoni, M. P. [1 ]
Pettifer, R. F.
Pascarelli, S.
Mathon, O.
机构
[1] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England
[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France
关键词
DiffXRD; DiffEXAFS; atomic strain; thermal expansion; strontium fluoride;
D O I
10.1107/S0909049506049971
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Differential EXAFS (DiffEXAFS) is a novel technique for measuring atomic perturbations on a local scale. Here a complementary technique for such studies is presented: differential X-ray diffraction (DiffXRD), which may be used to independently verify DiffEXAFS results whilst using exactly the same experimental apparatus and measurement technique. A test experiment has been conducted to show that DiffXRD can be used to successfully determine the thermal expansion coefficient of SrF2.
引用
收藏
页码:169 / 172
页数:4
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