共 50 条
- [1] X-ray diffraction measurements on metallic and semiconducting hexagonal NiS [J]. PHYSICAL REVIEW B-SOLID STATE, 1970, 2 (08): : 2859 - 2863
- [2] X-ray photoelectron diffraction measurements of hexagonal GaN(0001) thin films [J]. GALLIUM NITRIDE AND RELATED MATERIALS II, 1997, 468 : 263 - 268
- [3] X-ray diffraction from hexagonal dislocation networks [J]. PHILOSOPHICAL MAGAZINE, 2014, 94 (28) : 3247 - 3258
- [5] Some x-ray diffraction measurements on biotin [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1942, 64 : 1742 - 1743
- [7] INTEGRATED X-RAY DIFFRACTION MEASUREMENTS OF BERYLLIUM [J]. JOURNAL OF THE LESS-COMMON METALS, 1969, 18 (04): : 423 - &
- [9] X-RAY POWDER DIFFRACTION DATA FOR HEXAGONAL ZINC SULPHIDE [J]. ACTA CRYSTALLOGRAPHICA, 1955, 8 (11): : 733 - 734