Behavioural analysis of the pull-in dynamic transition

被引:45
|
作者
Rocha, LA
Cretu, E
Wolffenbuttel, RF
机构
[1] Delft Univ Technol, Fac EEMCS, Dept Microelect, NL-2628 CD Delft, Netherlands
[2] Melexis, Tessenderlo, Belgium
关键词
D O I
10.1088/0960-1317/14/9/006
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A careful analysis of the dynamics of the pull-in displacement reveals a metastable transient interval for devices with a Q factor lower than 1.2. The duration of this metastable regime could be up to 20 ms for the structure used in this work, depending on the damping. For typical device dimensions this regime dominates pull-in dynamics. This paper explicitly focuses on the metastable regime. The results of numerical simulations are confirmed with measurement results with the purpose of providing a better understanding of the underlying mechanisms. This may contribute to both improved actuator design and enhanced sensitivity of pressure sensors and accelerometers operating on pull-in time interval measurement. The sensitivity of the pull-in time to external accelerations is 6 x 10(-2) S/ms(-2) (similar to0.6 ms mg(-1)) for current devices and can be increased by design.
引用
收藏
页码:S37 / S42
页数:6
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