Swap time-aware garbage collection policy for NAND flash-based swap system

被引：0
|
作者：
Lin, M. W. [1 ]
Chen, S. Y. [2 ]
机构：
[1] Chongqing Univ, Coll Comp Sci, Chongqing 400044, Peoples R China
[2] Chongqing Univ, Sch Software Engn, Chongqing 400044, Peoples R China
来源：
ELECTRONICS LETTERS | 2013年 / 49卷 / 24期
基金：
中国国家自然科学基金;
关键词：
flash memories; NAND circuits; storage management; swap time-aware garbage collection policy; NAND flash-based swap system; STGC policy; cleaning cost reduction; wear-levelling; cleaning index value; victim block; normalised value; elapsed swap time; hot valid page; cold valid page; trace-driven simulations; synthetic trace; MEMORY;
D O I：
10.1049/el.2013.2324
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A swap time-aware garbage collection (STGC) policy for the NAND flash-based swap system is proposed, which focuses on reducing the cleaning cost and improving the degree of wear-levelling. STGC calculates the cleaning index value of each block to select a victim block and the normalised value of the elapsed swap time of each valid page within the victim blocks to identify the hot valid page and cold valid page. Trace-driven simulations with a synthetic trace show that the STGC outperforms the existing garbage collection policies.
引用
收藏
页码：1525 / +
页数：2
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