CAGC: A Content-aware Garbage Collection Scheme for Ultra-Low Latency Flash-based SSDs

被引:5
|
作者
Wu, Suzhen [1 ]
Du, Chunfeng [1 ]
Li, Haijun [1 ]
Jiang, Hong [2 ]
Shen, Zhirong [1 ]
Mao, Bo [1 ]
机构
[1] Xiamen Univ, Sch Informat, Xiamen, Fujian, Peoples R China
[2] Univ Texas Arlington, Arlington, TX 76019 USA
基金
中国国家自然科学基金;
关键词
Ultra-Low Latency Flash-based SSDs; Garbage Collection; Data Reduplication; Reference Count; Data Placement;
D O I
10.1109/IPDPS49936.2021.00025
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
With the advent of new flash-based memory technologies with ultra-low latency, directly applying inline data deduplication in flash-based storage devices can degrade the system performance since key deduplication operations lie on the shortened critical write path of such devices. To address the problem, we propose a Content-Aware Garbage Collection scheme (CAGC), which embeds the data deduplication into the data movement workflow of the Garbage Collection (GC) process in ultra-low latency flash-based SSDs. By parallelizing the operations of valid data pages migration, hash computing and flash block erase, the deduplication-induced performance overhead is alleviated and redundant page writes during the GC period are eliminated. To further reduce data writes and write amplification during GC, CAGC separates and stores data pages in different regions based on their reference counts. The performance evaluation of our CAGC prototype implemented in FlashSim shows that CAGC significantly reduces the number of flash blocks erased and data pages migrated during GC, leading to improved user I/O performance and reliability of ultra-low latency flash-based SSDs.
引用
收藏
页码:162 / 171
页数:10
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  • [1] On the Endurance of the d-Choices Garbage Collection Algorithm for Flash-Based SSDs
    Verschoren, Robin
    Van Houdt, Benny
    [J]. ACM TRANSACTIONS ON MODELING AND PERFORMANCE EVALUATION OF COMPUTING SYSTEMS, 2019, 4 (03)
  • [2] A Preliminary Study: Towards Parallel Garbage Collection for NAND Flash-Based SSDs
    Zhu, Guangyu
    Han, Jaehyun
    Son, Yongseok
    [J]. IEEE ACCESS, 2020, 8 : 223574 - 223587
  • [3] A Cache Management Scheme for Hiding Garbage Collection Latency in Flash-based Solid State Drives
    Xie, Wei
    Chen, Yong
    [J]. 2015 IEEE INTERNATIONAL CONFERENCE ON CLUSTER COMPUTING - CLUSTER 2015, 2015, : 486 - 487
  • [4] How to improve the performance of the d-choices garbage collection algorithm in flash-based SSDs
    Verschoren, Robin
    Van Houdt, Benny
    [J]. PROCEEDINGS OF THE 13TH EAI INTERNATIONAL CONFERENCE ON PERFORMANCE EVALUATION METHODOLOGIES AND TOOLS ( VALUETOOLS 2020), 2020, : 180 - 187
  • [5] BAGC: Buffer-Aware Garbage Collection for Flash-Based Storage Systems
    Lee, Sungjin
    Shin, Dongkun
    Kim, Jihong
    [J]. IEEE TRANSACTIONS ON COMPUTERS, 2013, 62 (11) : 2141 - 2154
  • [6] Data Recovery Aware Garbage Collection Mechanism in Flash-Based Storage Devices
    Paik, Joon-Young
    Jin, Rize
    Chung, Tae-Sun
    [J]. IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2018, E101D (09): : 2404 - 2408
  • [7] PACA: A Page Type Aware Read Cache Scheme in QLC Flash-based SSDs
    Chen, Qihui
    Wang, Shuai
    Zhou, You
    Wu, Fei
    Li, Shu
    Wang, Zhengyong
    Xie, Changsheng
    [J]. 2022 IEEE 40TH INTERNATIONAL CONFERENCE ON COMPUTER DESIGN (ICCD 2022), 2022, : 59 - 66
  • [8] Sampling-based Garbage Collection Metadata Management Scheme for Flash-based Storage
    Debnath, Biplob
    Krishnan, Srinivasan
    Xiao, Weijun
    Lilja, David J.
    Du, David H. C.
    [J]. 2011 IEEE 27TH SYMPOSIUM ON MASS STORAGE SYSTEMS AND TECHNOLOGIES (MSST), 2011,
  • [9] Swap-aware Garbage Collection Algorithm for NAND Flash-based Consumer Electronics
    Xu, Guangxia
    Wang, Manman
    Liu, Yanbing
    [J]. IEEE TRANSACTIONS ON CONSUMER ELECTRONICS, 2014, 60 (01) : 60 - 65
  • [10] ShadowGC Cooperative Garbage Collection with Multi-level Buffer for Performance Improvement in NAND flash-based SSDs
    Cui, Jinhua
    Zhang, Youlao
    Huang, Jianhang
    Wu, Weiguo
    Yang, Jun
    [J]. PROCEEDINGS OF THE 2018 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 2018, : 1247 - 1252