The higher-k phase formation in amorphous HfO2 films by swift heavy ion irradiation

被引:3
|
作者
Li, Zongzhen [1 ]
Liu, Jie [1 ]
Zhai, Pengfei [1 ]
Liu, Li [1 ,2 ]
Xu, Lijun [1 ]
Zhang, Shengxia [1 ]
Hu, Peipei [1 ]
Zeng, Jian [1 ]
机构
[1] Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
[2] Univ Chinese Acad Sci, Sch Nucl Sci & Technol, Beijing 100049, Peoples R China
基金
中国国家自然科学基金;
关键词
Heavy ion irradiation; Crystallization; Higher-k phase; HfO2; THIN-FILMS; THERMAL-STABILITY; IMPACT; HAFNIA; SI;
D O I
10.1016/j.jcrysgro.2022.126600
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The formation of higher-k phase HfO2 is challenging and attractive. In this study, the phase transition of pure HfO2 thin films was induced by swift heavy ions (SHIs) irradiation. The amorphous HfO2 films crystallized after SHIs irradiation and undergone a transformation of monoclinic to cubic/tetragonal phase with the increase of the ion fluences. The as-deposited HfO2 films take on nonstoichiometric state, and became close to the stoichiometric one under SHIs irradiation. This work provides an approach to stabilize the higher-k phase HfO2 and optimize the interface between HfO2 and Si by SHIs irradiation.
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页数:5
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