The interpretation of tapping mode images of polymer surfaces in Atomic Force Microscopy.

被引：0
|
作者：
Llewellyn, JP [1 ]
Sayers, P [1 ]
机构：
[1] Univ Wales, SEECS, Bangor LL57 1UT, Gwynedd, Wales
来源：
ELECTROSTATICS 1999 | 1999年 / 163卷
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The differential equation describing the motion of a vibrating AFM cantilever used in the tapping mode is solved numerically to find the phase of the vibrations. The effects of introducing a Coulomb interaction between the cantilever tip and the surface, and also an energy loss during the tapping process, are investigated.
引用
收藏
页码：403 / 406
页数：4
相关论文
共 50 条
  • [41] FRACTURED POLYMER SILICA FIBER SURFACE STUDIED BY TAPPING MODE ATOMIC-FORCE MICROSCOPY
    ZHONG, Q
    INNISS, D
    KJOLLER, K
    ELINGS, VB
    SURFACE SCIENCE, 1993, 290 (1-2) : L688 - L692
  • [42] Dynamic model of atomic force microscopy in tapping-mode
    Fan, Kang-Qi
    Jia, Jian-Yuan
    Zhu, Ying-Min
    Liu, Xiao-Yuan
    ACTA PHYSICA SINICA, 2007, 56 (11) : 6345 - 6351
  • [43] Tuning the interaction forces in tapping mode atomic force microscopy
    Stark, RW
    Schitter, G
    Stemmer, A
    PHYSICAL REVIEW B, 2003, 68 (08):
  • [44] Characterization of intermittent contact in tapping mode atomic force microscopy
    Zhao, Xiaopeng
    Dankowicz, Harry
    PROCEEDINGS OF THE ASME INTERNATIONAL DESIGN ENGINEERING TECHNICAL CONFERENCES AND COMPUTERS AND INFORMATION IN ENGINEERING CONFERENCE, VOL 6, PTS A-C, 2005, : 2011 - 2020
  • [45] Improving tapping mode atomic force microscopy with piezoelectric cantilevers
    Rogers, B
    Manning, L
    Sulchek, T
    Adams, JD
    ULTRAMICROSCOPY, 2004, 100 (3-4) : 267 - 276
  • [46] The role of adhesion in tapping-mode atomic force microscopy
    Sarid, D
    Hunt, JP
    Workman, RK
    Yao, X
    Peterson, CA
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S283 - S286
  • [47] The application of the atomic force microscopy.
    Brinksmeier, E
    Hoper, R
    Riemer, O
    MATERIALPRUFUNG, 1998, 40 (09): : 358 - 360
  • [48] Conformation of curdlan as observed by tapping mode atomic force microscopy
    Jin, Yang
    Zhang, Hongbin
    Yin, Yimei
    Nishinari, Katsuyoshi
    COLLOID AND POLYMER SCIENCE, 2006, 284 (12) : 1371 - 1377
  • [49] Self-sensing tapping mode atomic force microscopy
    Adams, JD
    Manning, L
    Rogers, B
    Jones, M
    Minne, SC
    SENSORS AND ACTUATORS A-PHYSICAL, 2005, 121 (01) : 262 - 266
  • [50] TAPPING MODE ATOMIC-FORCE MICROSCOPY - APPLICATIONS TO SEMICONDUCTORS
    PRATER, CB
    STRAUSSER, YE
    DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS AND DEVICES, 1994, (135): : 69 - 72
12345