X-ray scattering microscope with a Wolter mirror

被引:6
|
作者
Takano, H [1 ]
Aoki, S
Kumegawa, M
Watanabe, N
Ohhigashi, T
Aota, T
Yamamoto, K
Yokosuka, H
Tanoue, R
Tsujita, Y
Ando, M
机构
[1] JASRI Spring 8, Mikazuki, Hyogo 6795198, Japan
[2] Univ Tsukuba, Inst Phys Appl, Ibaraki 3058573, Japan
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2002年 / 73卷 / 07期
关键词
D O I
10.1063/1.1487888
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Full-field x-ray scattering microscopic images were obtained with a Wolter mirror (x10 magnification). A synchrotron radiation white beam (4-20 keV) from a bending magnet beamline at the Photon Factory was used to obtain x-ray scattering images. The system was available for multi-kilo-electron-volt x-ray range (4-12 keV) with the Wolter mirror. The image was formed only with scattered x rays from the object, which is kind of a dark-field image. Very low absorptive materials could be imaged with this microscope. Sensitivity of the system was evaluated and also the detection limit was estimated. (C) 2002 American Institute of Physics.
引用
收藏
页码:2629 / 2633
页数:5
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