Development of Binary Readout CMOS Monolithic Sensors for MIP Tracking

被引:9
|
作者
Degerli, Yavuz [1 ]
Besson, Auguste [2 ]
Claus, Gilles [2 ]
Combet, Michel [1 ]
Dorokhov, Andrei [2 ]
Dulinski, Wojciech [2 ]
Goffe, Mathieu [2 ]
Himmi, Abdelkader [2 ]
Li, Yan [1 ]
Orsini, Fabienne [1 ]
机构
[1] CEA Saclay, SEDI, IRFU, F-91191 Gif Sur Yvette, France
[2] ULP, IN2P3, IPHC, F-67037 Strasbourg, France
关键词
Active pixel sensor; charged particle detector; CMOS sensor; discriminator; MAPS; MIP; position sensitive detector; tracking; CHARGED-PARTICLE DETECTION; ACTIVE PIXEL SENSOR;
D O I
10.1109/TNS.2008.2009985
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Recently, CMOS Monolithic Active Pixels Sensors (MAPS) have become strong candidates for pixel detectors used in high energy physics experiments. A very good spatial resolution lower than 5 mu m can be obtained with these detectors. A recent fast MAPS chip, designed in AMS CMOS 0.35 mu m Opto process and called MIMOSA16 (HiMAPS2), was submitted to foundry in June 2006. The chip is a 128 x 32 pixels array where 8 columns have analog test outputs and 24 columns have their outputs connected to offset compensated discriminator stages. The pixel array is addressed row-wise. The array is divided in four blocks of pixels with different charge-to-voltage conversion factors and is controlled by a serially programmable sequencer. The sequencer operates as a pattern generator which delivers control signals both to the pixels and to the column-level discriminators. Discriminators have a common adjustable threshold. This chip is the basis of the final sensor of the EUDET-JRA1 beam telescope which will be installed at DESY in 2009. In this paper, laboratory tests results using a (55)Fe source together with beam tests results obtained at CERN using Minimum Ionizing Particles (MIPs) are presented
引用
收藏
页码:354 / 363
页数:10
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