March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults

被引：3
|
作者：
Masnita, M. I. [1 ]
Zuh, W. H. W. [1 ]
Sidek, R. M. [1 ]
Izhal, A. H. [1 ]
机构：
[1] Univ Putra Malaysia, Dept Elect & Elect Engn, Fac Engn, Serdang 43400, Selangor Darul, Malaysia
来源：
IEICE ELECTRONICS EXPRESS | 2009年 / 6卷 / 15期
关键词：
SRAM testing; march tests; march-based diagnostic algorithm; Functional Fault Models (FFMs); Stuck-At Faults (SAF); transition faults;
D O I：
10.1587/elex.6.1091
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
March tests have been widely used for detecting functional faults during SRAM testing. Recent development has extended the March test for diagnostic purpose to locate and identify the fault types. This paper analyses March algorithms for detection and diagnosis of Stuck-At Faults (SAFs) and Transition Faults (TFs). Unfortunately, the algorithms under studied are not able to distinguish between the two faults. Therefore, this paper proposes a new March-based diagnostic algorithm that can differentiate SAFs from TFs.
引用
收藏
页码：1091 / 1097
页数：7
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