A march-based fault location algorithm with partial and full diagnosis for all simple static faults in random access memories

被引：0

作者：

Harutunyan, G. ^{[1
]}

Vardanian, V. A. ^{[1
]}

Zorian, Y. ^{[1
]}

机构：

[1] Virage Log, 15-1 Khorenatsi Str, Yerevan 375010, Armenia

来源：

PROCEEDINGS OF THE 2007 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS | 2007年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper, we propose a multiphase March-like algorithm for partial and full diagnosis of all simple static faults in static Random Access Memories, as well as location of the position of the failed bit. In Phase 1, a March-like algorithm of complexity 2N is proposed for partial diagnosis to differentiate between single-cell and two-cell faults. In phase 2, for two-cell faults, we propose a March-like algorithm of complexity 41N for location of the position of the failed bit. In Phase 3, we used a March-like algorithm of a constant complexity for full diagnosis of all simple static faults.

引用

页码：145 / +

页数：2

共 12 条

[1] Minimal march-based fault location algorithm with partial diagnosis for all static faults in random access memories
Harutunyan, G.
Vardanian, V. A.
Zorian, Y.
[J]. PROCEEDINGS OF THE 2006 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, 2006, : 262 - +
[2] A March-based fault location algorithm for Static Random Access Memories
Vardanian, VA
Zorian, Y
[J]. PROCEEDINGS OF THE EIGHTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, 2002, : 256 - 261
[3] A March-based fault location algorithm for Static random access memories
Vardanian, VA
Zorian, Y
[J]. PROCEEDING OF THE 2002 IEEE INTERNATIONAL WORKSHOP ON MEMORY TECHNOLOGY, DESIGN AND TESTING, 2002, : 62 - 67
[4] A march-based algorithm for location and full diagnosis of all unlinked static faults
Gyonjyan, T. A.
Harutunyan, G.
Vardanian, V. A.
[J]. MTDT'06: 2006 IEEE INTERNATIONAL WORKSHOP ON MEMORY TECHNOLOGY, DESIGN, AND TESTING, PROCEEDINGS, 2006, : 9 - +
[5] An efficient March-based three-phase fault location and full diagnosis algorithm for realistic two-operation dynamic faults in Random Access Memories
Harutunyan, G.
Vardanian, V. A.
Zorian, Y.
[J]. 26TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2008, : 95 - +
[6] Minimal march test algorithm for detection of linked static faults in random access memories
Harutunyan, G.
Vardanian, V. A.
Zorian, Y.
[J]. 24TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2006, : 120 - +
[7] Minimal march tests for unlinked static faults in Random Access Memories
Harutunyan, G
Vardanian, VA
Zorian, Y
[J]. 23RD IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2005, : 53 - 59
[8] March test algorithm for unlinked static reduced three-cell coupling faults in random-access memories
Cascaval, P.
Cascaval, D.
[J]. MICROELECTRONICS JOURNAL, 2019, 93
[9] Low Power March Memory Test Algorithm for Static Random Access Memories
Kumar, G. Rajesh
Babulu, K.
[J]. INTERNATIONAL JOURNAL OF ENGINEERING, 2018, 31 (02): : 292 - 298
[10] March SR3C: A Test for a reduced model of all static simple three-cell coupling faults in random-access memories
Cascaval, Petru
Cascaval, Doina
[J]. MICROELECTRONICS JOURNAL, 2010, 41 (04) : 212 - 218

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