A method for profile measurements of small transverse size beams by means of a vibrating wire

被引:3
|
作者
Arutunian, S. G. [1 ]
Badalyan, S. A. [2 ]
Chung, M. [3 ]
Lazareva, E. G. [1 ]
Margaryan, A. V. [1 ]
Harutyunyan, G. S. [1 ]
机构
[1] Alikhanyan Natl Sci Lab, Yerevan 0036, Armenia
[2] Lebedev Inst Precise Mech & Comp Engn IPMCE, Moscow 119991, Russia
[3] Ulsan Natl Inst Sci & Technol, Ulsan 44919, South Korea
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2019年 / 90卷 / 07期
基金
新加坡国家研究基金会;
关键词
Laser beams;
D O I
10.1063/1.5092371
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A method for profile measurements of small transverse size beams by means of a vibrating wire is proposed. The main idea is to use the vibrating wire motion during its oscillations as a scanning mechanism and synchronously measure the scattered/reflected particles/photons created through the interactions of the measured beam with the wire. The method is expected to be applicable for thin beams in particle accelerators. The proof-of-principle test results, obtained using a laser beam, are presented.
引用
收藏
页数:9
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  • [21] Transverse beam envelope measurements and the limitations of the 3-screen emittance method for space-charge dominated beams
    Power, JG
    Wang, H
    Conde, ME
    Gai, W
    Konecny, R
    Liu, W
    Yusof, Z
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2005, 546 (03): : 345 - 355
  • [22] A novel method for sub-micrometer transverse electron beam size measurements using optical transition radiation
    Aryshev, A.
    Boogert, S. T.
    Howell, D.
    Karataev, P.
    Terunuma, N.
    Urakawa, J.
    [J]. VIII INTERNATIONAL SYMPOSIUM ON RADIATION FROM RELATIVISTIC ELECTRONS IN PERIODIC STRUCTURES (RREPS-2009), 2010, 236
  • [23] Absolute dose measurements by means of a small cylindrical ionization chamber for very high dose per pulse high energy electron beams
    Karaj, E.
    Righi, S.
    Di Martino, F.
    [J]. MEDICAL PHYSICS, 2007, 34 (03) : 952 - 958
  • [24] Characterization of the near-field profile of semiconductor lasers and the spot size of tightly focused laser beams from far-field measurements
    Guttman, JL
    Fleischer, JM
    [J]. LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 2002 AND 7TH INTERNATIONAL WORKSHOP ON LASER BEAM AND OPTICS CHARACTERIZATION, 2003, 4932 : 581 - 589
  • [25] A comparison of surface doses for very small field size x-ray beams: Monte Carlo calculations and radiochromic film measurements
    Morales, J. E.
    Hill, R.
    Crowe, S. B.
    Kairn, T.
    Trapp, J. V.
    [J]. AUSTRALASIAN PHYSICAL & ENGINEERING SCIENCES IN MEDICINE, 2014, 37 (02) : 303 - 309
  • [26] A comparison of surface doses for very small field size x-ray beams: Monte Carlo calculations and radiochromic film measurements
    J. E. Morales
    R. Hill
    S. B. Crowe
    T. Kairn
    J. V. Trapp
    [J]. Australasian Physical & Engineering Sciences in Medicine, 2014, 37 : 303 - 309
  • [27] Small field size dose-profile measurements using gel dosimeters, gafchromic films and micro-thermoluminescent dosimeters
    Wong, C. J.
    Ackerly, T.
    He, C.
    Patterson, W.
    Powell, C. E.
    Qiao, G.
    Solomon, D. H.
    Meder, R.
    Geso, M.
    [J]. RADIATION MEASUREMENTS, 2009, 44 (03) : 249 - 256
  • [28] CONFIGURATION-FACTORS AND CONTACT-EFFECTS RELATIVE TO RESISTANCE-MEASUREMENTS ON SMALL SAMPLES WITH THE 4-WIRE METHOD
    LAURENT, C
    [J]. ONDE ELECTRIQUE, 1988, 68 (04): : 34 - 39
  • [29] DETERMINATION OF THE DEGREE OF ANISOMETRICITY AND SIZE DISTRIBUTION OF POLYDISPERSE PARTICLES OF UNKNOWN SHAPE BY MEANS OF A SMALL-ANGLE SCATTERING METHOD
    PLAVNIK, GM
    TROSHKIN, GN
    KOZHEVNIKOV, AI
    RUZINOV, VL
    KHRUSTALEVA, GN
    [J]. KRISTALLOGRAFIYA, 1985, 30 (06): : 1064 - 1071