A novel method for sub-micrometer transverse electron beam size measurements using optical transition radiation

被引：4

作者：

Aryshev, A. ^{[1
]}

Boogert, S. T. ^{[2
]}

Howell, D. ^{[3
]}

Karataev, P. ^{[2
]}

Terunuma, N. ^{[1
]}

Urakawa, J. ^{[1
]}

机构：

[1] KEK, 1-1 Oho, Tsukuba, Ibaraki 3050801, Japan

[2] John Adams Inst Royal Holloway, Egham TW20 0EX, Surrey, England

[3] Univ Oxford, John Adams Inst, Oxford OX1 3RH, England

来源：

VIII INTERNATIONAL SYMPOSIUM ON RADIATION FROM RELATIVISTIC ELECTRONS IN PERIODIC STRUCTURES (RREPS-2009) | 2010年 / 236卷

关键词：

D O I：

10.1088/1742-6596/236/1/012008

中图分类号：

O57 [原子核物理学、高能物理学];

学科分类号：

070202 ;

摘要：

Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in various facilities worldwide. The resolution of the monitor is defined by so-called Point Spread Function (PSF), source distribution generated by a single electron and projected by an optical system onto a screen. In this paper we represent the development of a novel sub-micrometre electron beam profile monitor based on the measurements of the PSF structure. The first experimental results are presented and future plans on the optimization of the monitor are discussed

引用

页数：7

共 50 条

[1] Sub-micrometer transverse beam size diagnostics using optical transition radiation
Kruchinin, K.
Aryshev, A.
Karataev, P.
Bolzon, B.
Lefevre, T.
Mazzoni, S.
Shevelev, M.
Boogert, S. T.
Nevay, L. J.
Terunuma, N.
Urakawa, J.
[J]. RREPS13 AND MEGHRI13, 2014, 517
[2] Resolution of transverse electron beam measurements using optical transition radiation
Ischebeck, R
Decker, FJ
Hogan, M
Iverson, RH
Krejcik, P
Siemann, RH
Walz, D
Lincoln, M
Clayton, CE
Huang, CK
Lu, W
Deng, SZ
Oz, E
[J]. 2005 IEEE PARTICLE ACCELERATOR CONFERENCE (PAC), VOLS 1-4, 2005, : 1928 - 1930
[3] Electron wind induced mass transport in sub-micrometer size wires
Zehe, A
Ramírez, A
Patiño, A
[J]. CROSS-DISCIPLINARY APPLIED RESEARCH IN MATERIALS SCIENCE AND TECHNOLOGY, 2005, 480 : 463 - 467
[4] Sub-Micrometer Size Structure Fabrication Using a Conductive Polymer
Sone, Junji
Yamada, Katsumi
Asami, Akihisa
Chen, Jun
[J]. MICROMACHINES, 2015, 6 (01): : 96 - 109
[5] Ultrafast scanning electron microscopy with sub-micrometer optical pump resolution
Garming, Mathijs W. H.
Weppelman, I. Gerward C.
Lee, Martin
Stavenga, Thijs
Hoogenboom, Jacob P.
[J]. APPLIED PHYSICS REVIEWS, 2022, 9 (02):
[6] Transverse Beam Shape Measurements of Intense Proton Beams Using Optical Transition Radiation
Scarpine, Victor E.
[J]. PROCEEDINGS OF THE 2ND INTERNATIONAL CONFERENCE ON TECHNOLOGY AND INSTRUMENTATION IN PARTICLE PHYSICS (TIPP 2011), 2012, 37 : 2123 - 2128
[7] Comparison of three essential sub-micrometer aerosol measurements: Mass, size and shape
Yao, Qi
Asa-Awuku, Akua
Zangmeister, Christopher D.
Radney, James G.
[J]. AEROSOL SCIENCE AND TECHNOLOGY, 2020, 54 (10) : 1197 - 1209
[8] Sub-micron scale transverse electron beam size diagnostics methodology based on the analysis of optical transition radiation source distribution
Aryshev, A.
Ainsworth, R.
Aumeyr, T.
Bergamaschi, M.
Boogert, S. T.
Karataev, P.
Kieffer, R.
Kruchinin, K.
Lefevre, T.
Mazzoni, S.
Nevay, L.
Terunuma, N.
Urakawa, J.
[J]. JOURNAL OF INSTRUMENTATION, 2020, 15 (01):
[9] Effects of transverse electron beam size on transition radiation angular distribution
Chiadroni, E.
Castellano, M.
Cianchi, A.
Honkavaara, K.
Kube, G.
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2012, 673 : 56 - 63
[10] NanoSIMS measurements of sub-micrometer particles using the local thresholding technique
Hao, Jialong
Yang, Wei
Huang, Wenjuan
Xu, Yuchen
Lin, Yangting
Changela, Hitesh
[J]. SURFACE AND INTERFACE ANALYSIS, 2020, 52 (05) : 234 - 239

← 1 2 3 4 5 →