A novel method for sub-micrometer transverse electron beam size measurements using optical transition radiation

被引：4
|
作者：
Aryshev, A. [1 ]
Boogert, S. T. [2 ]
Howell, D. [3 ]
Karataev, P. [2 ]
Terunuma, N. [1 ]
Urakawa, J. [1 ]
机构：
[1] KEK, 1-1 Oho, Tsukuba, Ibaraki 3050801, Japan
[2] John Adams Inst Royal Holloway, Egham TW20 0EX, Surrey, England
[3] Univ Oxford, John Adams Inst, Oxford OX1 3RH, England
来源：
VIII INTERNATIONAL SYMPOSIUM ON RADIATION FROM RELATIVISTIC ELECTRONS IN PERIODIC STRUCTURES (RREPS-2009) | 2010年 / 236卷
关键词：
D O I：
10.1088/1742-6596/236/1/012008
中图分类号：
O57 [原子核物理学、高能物理学];
学科分类号：
070202 ;
摘要：
Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in various facilities worldwide. The resolution of the monitor is defined by so-called Point Spread Function (PSF), source distribution generated by a single electron and projected by an optical system onto a screen. In this paper we represent the development of a novel sub-micrometre electron beam profile monitor based on the measurements of the PSF structure. The first experimental results are presented and future plans on the optimization of the monitor are discussed
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页数：7
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