Functional fault simulation of VHDL gate level models

被引:4
|
作者
Aftabjahani, SA
Navabi, Z
机构
来源
VHDL INTERNATIONAL USERS' FORUM, PROCEEDINGS | 1997年
关键词
D O I
10.1109/VIUF.1997.623925
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A method of fault injection and fault simulation is being proposed here. A gate level circuit if modified to include logic gates where faults are to be injected. Values assigned to the inputs of the new additions of the circuit have the effect of injecting stuck-at faults at various lines of the original circuit. A functional model is obtained to represent the new altered circuit. This faultable model can be simulated using a standard VHDL simulator. A program for obtaining this model and creating a simulatable VHDL model has been developed. A comparison with other VHDL based fault simulations will be given.
引用
收藏
页码:18 / 23
页数:2
相关论文
共 50 条
  • [41] SIMULATION ACCELERATOR SPEEDS BEHAVIORAL-LEVEL VHDL
    TUCK, B
    COMPUTER DESIGN, 1992, 31 (08): : 121 - 121
  • [42] FAULT MODELS OF CMOS TRANSMISSION GATE
    MILOVANOVIC, DP
    LITOVSKI, VB
    INTERNATIONAL JOURNAL OF ELECTRONICS, 1991, 71 (04) : 675 - 683
  • [43] Developing and distributing component-level VHDL models
    Calhoun, JS
    Madisetti, VK
    Reese, RB
    Egolf, T
    JOURNAL OF VLSI SIGNAL PROCESSING SYSTEMS FOR SIGNAL IMAGE AND VIDEO TECHNOLOGY, 1997, 15 (1-2): : 111 - 126
  • [44] GATE-LEVEL SIMULATION
    DABREU, MA
    IEEE DESIGN & TEST OF COMPUTERS, 1985, 2 (06): : 63 - 71
  • [45] Developing and Distributing Component-Level VHDL Models
    J. Scott Calhoun
    Vijay K. Madisetti
    Robert B. Reese
    Thomas Egolf
    Journal of VLSI signal processing systems for signal, image and video technology, 1997, 15 : 111 - 126
  • [46] Register transfer level VHDL models without clocks
    Mutz, M
    DESIGN, AUTOMATION AND TEST IN EUROPE, PROCEEDINGS, 1998, : 153 - 158
  • [47] Implications of VHDL timing models on simulation and software synthesis
    Krishnaswamy, V
    Gupta, R
    Banerjee, P
    JOURNAL OF SYSTEMS ARCHITECTURE, 1997, 44 (01) : 23 - 36
  • [48] Behavioral fault modeling and simulation using VHDL-AMS to speed-up analog fault simulation
    Kiliç, Y
    Zwolinski, M
    ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2004, 39 (02) : 177 - 190
  • [49] Behavioral Fault Modeling and Simulation Using VHDL-AMS to Speed-Up Analog Fault Simulation
    Y. Kiliç
    M. Zwoliński
    Analog Integrated Circuits and Signal Processing, 2004, 39 : 177 - 190
  • [50] Statistical gate level simulation via voltage controlled current source models
    Liu, Bao
    Kahng, Andrew B.
    BMAS 2006: PROCEEDINGS OF THE 2006 IEEE INTERNATIONAL BEHAVIORAL MODELING AND SIMULATION WORKSHOP, 2006, : 23 - +