Evaluation of Relative X-Ray Imaging Detector Performance Using the Metric of Relative Object Detectability (ROD)

被引:0
|
作者
Singh, V.
Jain, A.
Nagesh, S. Setlur
Bednarek, D.
Rudin, S.
机构
关键词
D O I
10.1118/1.4815352
中图分类号
R8 [特种医学]; R445 [影像诊断学];
学科分类号
1002 ; 100207 ; 1009 ;
摘要
引用
收藏
页数:1
相关论文
共 50 条
  • [41] On the evolution and relative merits of hard X-ray phase-contrast imaging methods
    Wilkins, S. W.
    Nesterets, Ya. I.
    Gureyev, T. E.
    Mayo, S. C.
    Pogany, A.
    Stevenson, A. W.
    PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2014, 372 (2010):
  • [42] High resolution X-ray imaging using a silicon strip detector
    Beuville, E
    Cahn, R
    Cederström, B
    Danielsson, M
    Hall, A
    Hasegawa, B
    Luo, L
    Lundqvist, M
    Nygren, D
    Oltman, E
    Walton, J
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (06) : 3059 - 3063
  • [43] High resolution X-ray imaging using a silicon strip detector
    Beuville, E
    Cahn, R
    Cederstrom, B
    Danielsson, M
    Hall, A
    Hasegawa, B
    Luo, L
    Lundqvist, M
    Nygren, D
    Oltman, E
    Vestlund, J
    Walton, J
    1997 IEEE NUCLEAR SCIENCE SYMPOSIUM - CONFERENCE RECORD, VOLS 1 & 2, 1998, : 1269 - 1273
  • [44] New type of imaging X-ray detector using a capillary plate
    Sakurai, H
    Saito, S
    Noma, M
    Gunji, S
    Tsukahara, M
    Tamura, T
    EUX, X-RAY, AND GAMMA-RAY INSTRUMENTATION FOR ASTRONOMY VIII, 1997, 3114 : 481 - 487
  • [45] RELATIVE X-RAY SENSITIVITY OF METAPHASE AND INTERPHASE CHROMOSOMES
    SPARROW, AH
    NATURE, 1948, 162 (4121) : 651 - 652
  • [47] The relative reflectivity of some X-ray spectrometer crystals
    Faessler, A.
    Kuepferle, G.
    ZEITSCHRIFT FUR PHYSIK, 1935, 93 (3-4): : 237 - 244
  • [48] The relative costs of proton and X-ray radiation therapy
    Goitein, M
    Jermann, M
    CLINICAL ONCOLOGY, 2003, 15 (01) : S37 - S50
  • [49] On the relative positions and intensities of lines in in X-ray spectra
    Duane, W
    Patterson, RA
    PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 1920, 6 : 518 - 527
  • [50] Relative x-ray reflectometry of discrete layered structures
    A. G. Tur’yanskiĭ
    S. A. Aprelov
    N. N. Gerasimenko
    I. V. Pirshin
    V. M. Senkov
    Technical Physics Letters, 2007, 33 : 224 - 227