Guest Editors' Introduction: Top Papers from the 2015 International Test Conference

被引：0

作者：

Nicolici, Nicola ^{[1
]}

Stratigopoulos, Haralampos-G. ^{[2
]}

机构：

[1] McMaster Univ, Dept Elect & Comp Engn, Hamilton, ON L8S 4L8, Canada

[2] UPMC Univ Paris 6, Sorbonne Univ, CNRS, LIP6, Paris, France

来源：

IEEE DESIGN & TEST | 2016年 / 33卷 / 06期

关键词：

D O I：

10.1109/MDAT.2016.2594440

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：5 / 6

页数：2

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