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- [31] Understanding Copper Activation and Xanthate Adsorption on Sphalerite by Time-of-Flight Secondary Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and in Situ Scanning Electrochemical Microscopy JOURNAL OF PHYSICAL CHEMISTRY C, 2013, 117 (39): : 20089 - 20097
- [32] X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry study of the role of Ti and TiN caps on the cobalt/SiO2 interface JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1999, 17 (04): : 1244 - 1249
- [34] Insights on Semiconductor-Metal Transition in Indium-doped Zinc Oxide from X-ray Photoelectron Spectroscopy, Time-of-flight Secondary Ion Mass Spectrometry and X-ray Diffraction INTERNATIONAL CONFERENCE ON NANO-ELECTRONIC TECHNOLOGY DEVICES AND MATERIALS (IC-NET 2015), 2016, 1733
- [36] X-ray Photoelectron Spectroscopy and Time-Of-Flight Secondary Ion Mass Spectroscopy studies of electrodeposited molybdenum oxysulfide cathodes for lithium and lithium-ion microbatteries Journal of Solid State Electrochemistry, 2008, 12 : 273 - 285
- [37] Characterization of gate oxynitrides by means of time of flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy. Quantification of nitrogen JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2002, 20 (03): : 616 - 621
- [39] Static secondary ion mass spectrometry (SSSIM) and X-ray photoelectron spectroscopy (XPS) studies of polycrystalline Ag/Ru supported bimetallic alloy system JOURNAL OF THE CHEMICAL SOCIETY OF PAKISTAN, 1995, 17 (03): : 138 - 140