Research on analog circuit fault automatic test diagnose method

被引：0

作者：

Chen, GS ^{[1
]}

Song, XM ^{[1
]}

Wang, GF ^{[1
]}

Liu, SL ^{[1
]}

机构：

[1] Inst Ordnance Technol, Shijiazhuang 050000, Peoples R China

来源：

ICEMI'2001: FIFTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT AND INSTRUMENTS, VOL 1, CONFERENCE PROCEEDINGS | 2001年

关键词：

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

The theory and method of the analog circuit fault diagnose are presented firstly in the article, and based on the concept of the artificial intelligence expert system, a method of circuit analysis and diagnosis is introduced. By using the characteristic data of the component to build up the expert system for analog circuit fault diagnose, it can enhance the accuracy rating and the percentage of coverage of the analog circuit effectively.

引用

页码：580 / 583

页数：4

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