Secondary Fluorescence Enhancement in Confocal X-ray Microscopy Analysis

被引：22
|
作者：
Sokaras, Dimosthenis [1 ]
Karydas, Andreas-Germanos [1 ]
机构：
[1] NCSR Demokritos, Inst Nucl Phys, GR-15310 Athens, Greece
来源：
ANALYTICAL CHEMISTRY | 2009年 / 81卷 / 12期
关键词：
XRF; PIXE; RADIATION; THICKNESS; FACILITY; SAMPLES;
D O I：
10.1021/ac900688n
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
In the present work, the influence of the secondary fluorescence enhancement in confocal X-ray microscopy analysis is studied when stratified type of materials are examined. Through a proper mathematical formalism, an exact global theoretical model is presented which accounts for the secondary fluorescence enhancement when either particle (3D-Micro particle induced X-ray emission) or photon (3D-Micro X-ray fluorescence) microbeams are used in the excitation channel. The contribution of the secondary fluorescence effect to the confocal X-ray intensity profiles was calculated for some typical representative cases. In addition, the influence of several experimental parameters was examined in terms of their influence in the absolute intensity and shape of the secondary fluorescence intensity profile.
引用
收藏
页码：4946 / 4954
页数：9
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