Detection of Subsurface Inhomogeneities in Dielectric Materials by the Microwave method

The results of the theoretical and practical investigations of the authors in the field of nondestructive testing of dielectric materials are summarized. In particular, a device for the electromagnetic microwave measurements was created and a mathematical model of the measured data was proposed. A procedure of processing the accumulated data aimed at detecting subsurface inhomogeneities in dielectric materials is developed. As a specific feature of the proposed procedure, we can mention the fact that the created measuring scheme operates according to the principle of determination of amplitudes. Despite the absence of phase data, the appropriate treatment enables us to visualize the external surface and the first interface of materials. The mathematical analysis of the components of scattered fields gives us a possibility to get a quantitative interpretation of the results of measurements. The theoretical conclusions are confirmed by the experimental data.