Near-field microwave tomography of subsurface dielectric layers

被引：2
|
作者：
Yu. A. Gayday
V. S. Sidorenko
O. V. Sinkevych
机构：
[1] Taras Shevchenko National University,
来源：
Radioelectronics and Communications Systems | 2012年 / 55卷 / 3期
关键词：
Dielectric Permittivity; Direct Problem; Microwave Tomography; Hide Object; Image Deconvolution;
D O I：
10.3103/S0735272712030041
中图分类号：
学科分类号：
摘要：
There is represented a method of 3D visualization of a structure of dielectric objects with small loss on a basis of data, obtained by scanning with near-field microwave microscope. Theoretical model was proven by means of experimental research of amount of test objects. We researched possibility of probes with complex geometry application for defectoscopy of dielectric materials analysis of volumetric non-uniformities.
引用
收藏
页码：131 / 135
页数：4
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