Thickness-dependent electronic structure in ultrathin LaNiO3 films under tensile strain

被引:26
|
作者
Yoo, Hyang Keun [1 ,2 ]
Hyun, Seung Ill [3 ]
Chang, Young Jun [4 ,5 ]
Moreschini, Luca [5 ]
Sohn, Chang Hee [1 ,2 ]
Kim, Hyeong-Do [1 ,2 ]
Bostwick, Aaron [5 ]
Rotenberg, Eli [5 ]
Shim, Ji Hoon [3 ,6 ]
Noh, Tae Won [1 ,2 ]
机构
[1] Inst for Basic Sci Korea, Ctr Correlated Electron Syst, Seoul 151747, South Korea
[2] Seoul Natl Univ, Dept Phys & Astron, Seoul 151747, South Korea
[3] Pohang Univ Sci & Technol, Dept Chem, Pohang 790784, South Korea
[4] Univ Seoul, Dept Phys, Seoul 130743, South Korea
[5] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Adv Light Source, Berkeley, CA 94720 USA
[6] Pohang Univ Sci & Technol, Div Adv Nucl Engn, Pohang 790784, South Korea
基金
瑞士国家科学基金会; 新加坡国家研究基金会;
关键词
METAL-INSULATOR; PEROVSKITES; TRANSITIONS; CROSSOVER; STATE;
D O I
10.1103/PhysRevB.93.035141
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We investigated electronic-structure changes of tensile-strained ultrathin LaNiO3 (LNO) films from ten to one unit cells (UCs) using angle-resolved photoemission spectroscopy (ARPES). We found that there is a critical thickness t(c) between four and three UCs below which Ni e(g) electrons are confined in two-dimensional space. Furthermore, the Fermi surfaces (FSs) of LNO films below t(c) consist of two orthogonal pairs of one-dimensional (1D) straight parallel lines. Such a feature is not accidental as observed in constant-energy surfaces at all binding energies, which is not explained by first-principles calculations or the dynamical mean-field theory. The ARPES spectra also show anomalous spectral behaviors, such as no quasiparticle peak at the Fermi momentum but fast band dispersion comparable to the bare-band one, which is typical in a 1D system. As its possible origin, we propose 1D FS nesting, which also accounts for FS superstructures observed in ARPES.
引用
收藏
页数:7
相关论文
共 50 条
  • [41] Thickness-dependent electronic band structure in MBE-grown hexagonal InTe films
    Matetskiy, A. V.
    Mararov, V. V.
    Mihalyuk, A. N.
    Denisov, N. V.
    Eremeev, S. V.
    Zotov, A. V.
    Saranin, A. A.
    PHYSICAL REVIEW B, 2022, 106 (16)
  • [42] Structure and thickness-dependent lattice parameters of ultrathin epitaxial Pr2O3 films on Si(001)
    Schroeder, T
    Lee, TL
    Zegenhagen, J
    Wenger, C
    Zaumseil, P
    Müssig, HJ
    APPLIED PHYSICS LETTERS, 2004, 85 (07) : 1229 - 1231
  • [43] Thickness-dependent electronic structure and interfacial behaviors of iron on faceted MgO(111) films
    Xue, Mingshan
    Guo, Qinlin
    CHEMICAL PHYSICS LETTERS, 2012, 551 : 92 - 95
  • [44] Thickness-dependent metal-insulator transition in epitaxial SrRuO3 ultrathin films
    Shen, Xuan
    Qiu, Xiangbiao
    Su, Dong
    Zhou, Shengqiang
    Li, Aidong
    Wu, Di
    JOURNAL OF APPLIED PHYSICS, 2015, 117 (01)
  • [45] Low-dimensional Mott material: Transport in ultrathin epitaxial LaNiO3 films
    Son, Junwoo
    Moetakef, Pouya
    LeBeau, James M.
    Ouellette, Daniel
    Balents, Leon
    Allen, S. James
    Stemmer, Susanne
    APPLIED PHYSICS LETTERS, 2010, 96 (06)
  • [46] Evaluation of strain-dependent dielectric properties in BaTiO3/LaNiO3 and (Ba, Sr) TiO3/LaNiO3 artificial superlattice films on LaNiO3-coated SrTiO3 substrates
    Liang, YC
    Lee, HY
    Liu, HJ
    Wu, KF
    Wu, TB
    Lee, CH
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2005, 152 (09) : F129 - F132
  • [47] Thickness-Dependent Optical Constants and Annealed Phase Transitions of Ultrathin ZnO Films
    Zheng, Hua
    Zhang, Rong-Jun
    Xu, Ji-Ping
    Wang, Shu-Xia
    Zhang, Tian-Ning
    Sun, Yan
    Zheng, Yu-Xiang
    Wang, Song-You
    Chen, Xin
    Chen, Liang-Yao
    Dai, Ning
    JOURNAL OF PHYSICAL CHEMISTRY C, 2016, 120 (39): : 22532 - 22538
  • [48] Joint effect of composition and strain on the anomalous transport properties of LaNiO3 films
    Zhu, Mingwei
    Komissinskiy, Philipp
    Radetinac, Aldin
    Wang, Zhanjie
    Alff, Lambert
    JOURNAL OF APPLIED PHYSICS, 2015, 117 (15)
  • [49] Thickness-dependent optical properties of yttrium fluoride ultrathin films in the visible band
    Shan, Yao
    Liu, Pian
    Chen, Yao
    Tu, Huatian
    Zhang, Haotian
    Zheng, Yuxiang
    Zhang, Rongjun
    Wang, Songyou
    Chen, Liangyao
    OPTICAL MATERIALS EXPRESS, 2020, 10 (12) : 3306 - 3314
  • [50] Systematic effects of Ti doping on the electronic properties of LaNiO3 thin films
    Tomar, Sourav Singh
    Yadav, Ekta
    Soni, Kavita
    Mavani, K. R.
    BULLETIN OF MATERIALS SCIENCE, 2021, 44 (02)