Total Ionizing Dose Effect in Tri-gate Silicon Ferroelectric Transistor Memory

For the first time, we demonstrate the survivability of programmed states in a ferroelectric field effect transistor (FeFET) memory under gamma-ray irradiation. The un-irradiated Tri-gate Si FeFET (control) shows a large memory window (MW) of similar to 1.6V, a high read current window of similar to 2x10(5), a long retention of 2.3x10(6)s (similar to 27 days) and high endurance (>10(8) cycles). The Tri-gate FeFETs, when exposed to radiation, retain ferroelectric hysteresis with a current window >10(2) up to a high radiation dose of 10Mrad. This confirms the survivability of the FeFETs and makes FeFET a potential candidate for data storage and compute-in-memory (CIM) in harsh ionizing environment. Analysis of array-level performance of FeFET-based CIM accelerator trained on CIFAR-10 dataset using VGG-8 neural network model under 5Mrad and 10Mrad radiation shows inference accuracy of 90% and 80%, respectively, versus 92% for control.