Hydrogen-related defects in single crystalline CVD homoepitaxial diamond film studied by EPR

被引:23
|
作者
Mizuochi, N
Watanabe, H
Isoya, J
Okushi, H
Yamasaki, S
机构
[1] Univ Tsukuba, Inst Lib & Informat Sci, Tsukuba, Ibaraki 3058550, Japan
[2] Natl Inst Ind Sci & Technol, Diamond Res Ctr, AIST, Tsukuba, Ibaraki 3058568, Japan
关键词
plasma CVD diamond film; hydrogen; defect; electron paramagnetic resonance;
D O I
10.1016/j.diamond.2003.11.028
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Single crystalline chemical vapour deposition (CVD) homoepitaxial diamond films have been studied by means of electron paramagnetic resonance (EPR). Hydrogen-related defects similar to the H1 center which is accompanied by nearby hydrogen have been observed at g = 2.0028 +/- 0.0002. From the thickness dependence of the signal intensity, it has been revealed that the hydrogen-related defects distribute uniformly along the depth direction in diamond films. From the non-epitaxial crystallites (NC) density dependence of the signal intensity, it has been indicated that the hydrogen-related defects do not originate from the NC. As for the thermal stability of the centers, the signal intensity does not change after annealing up to 1300 degreesC. These results are consistent with the hydrogen-related defects being distributed over the bulk of diamond film. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:765 / 768
页数:4
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