Plasma parameters and active species kinetics in CF4/O2/Ar gas mixture: Effects of CF4/O2 and O2/Ar mixing ratios

被引:0
|
作者
Lee, Junmyung [1 ]
Kwon, Kwang-Ho [1 ]
Efremov, A. [2 ]
机构
[1] Korea Univ, Dept Control & Instrumentat Engn, 2511 Sejong Ro, Sejong 339700, South Korea
[2] Ivanovo State Univ Chem & Technol, Dept Elect Devices & Mat Technol, 7 Sheremetevsky Av, Ivanovo 15300, Russia
关键词
CF4; plasma; diagnostics; modeling; reaction kinetics; MODEL-BASED ANALYSIS; SURFACE KINETICS; SIMULATION;
D O I
10.1117/12.2266348
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The effects of both CF4/O-2 and O-2/Ar mixing ratios in three-component CF4/O-2/Ar mixture on plasma parameters, densities and fluxes of active species determining the dry etching kinetics were analyzed. The investigation combined plasma diagnostics by Langmuir probes and zero-dimensional plasma modeling. It was found that the substitution of CF4 for O-2 at constant fraction of Ar in a feed gas produces the non-monotonic change in F atom density, as it was repeatedly reported for the binary CF4/O-2 gas mixtures. At the same time, the substitution of Ar for O-2 at constant fraction of CF4 results in the monotonic increase in F atom density toward more oxygenated plasmas. The natures of these phenomena as well as theirs possible impacts on the etching/polymerization kinetics were discussed in details.
引用
收藏
页数:8
相关论文
共 50 条
  • [41] Comparative Study on the Etching Characteristics of ArF and EUV Resists in Dual-frequency Superimposed Capacitively-coupled CF4/O2/Ar and CF4/CHF3/O2/Ar Plasmas
    Kwon, B. S.
    Kim, J. S.
    Lee, N. -E.
    Lee, S. K.
    Park, Sung Wook
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2009, 55 (04) : 1465 - 1471
  • [42] Novel technique to pattern silver using CF4 and CF4/O2 glow discharges
    Nguyen, P
    Zeng, YX
    Alford, TL
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (01): : 158 - 165
  • [43] Gas-phase parameters and densities of atomic species in Cl2 + O2 + Ar plasma: Effects of O2/Ar and Cl2/Ar mixing ratios
    Efremov, Alexander
    Amirov, Ildar
    Izyumov, Mikhail
    VACUUM, 2023, 207
  • [44] ANALYSIS OF NONUNIFORMITIES IN THE PLASMA-ETCHING OF SILICON WITH CF4/O2
    KAO, AS
    STENGER, HG
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1990, 137 (03) : 954 - 960
  • [45] Surface characterization of nickel alloy plasma-treated by O2/CF4 mixture
    Chan-Park, MB
    Gao, JX
    Koo, AHL
    JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 2003, 17 (15) : 1979 - 2004
  • [46] PARAMETRIC MODELING OF CRYSTALLINE QUARTZ RIE IN CF4/O2 PLASMA
    POPOVA, K
    SPANGENBERG, B
    ORLINOV, V
    VACUUM, 1991, 42 (07) : 495 - 497
  • [47] Surface characterization of nickel alloy plasma-treated by O2/CF4 mixture
    Chan-Park, M.B. (mbechan@ntu.edu.sg), 1979, VSP BV (17):
  • [48] ETCHING UNIFORMITIES OF SILICON IN CF4 + 4-PERCENT O2 PLASMA
    DOKEN, M
    MIYATA, I
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (12) : 2235 - 2239
  • [49] On the LPCVD-Formed SiO2 Etching Mechanism in CF4/Ar/O2 Inductively Coupled Plasmas: Effects of Gas Mixing Ratios and Gas Pressure
    Son, Jinyoung
    Efremov, Alexander
    Chun, Inwoo
    Yeom, Geun Young
    Kwon, Kwang-Ho
    PLASMA CHEMISTRY AND PLASMA PROCESSING, 2014, 34 (02) : 239 - 257
  • [50] On the LPCVD-Formed SiO2 Etching Mechanism in CF4/Ar/O2 Inductively Coupled Plasmas: Effects of Gas Mixing Ratios and Gas Pressure
    Jinyoung Son
    Alexander Efremov
    Inwoo Chun
    Geun Young Yeom
    Kwang-Ho Kwon
    Plasma Chemistry and Plasma Processing, 2014, 34 : 239 - 257