Susceptibility of a Sigma-Delta Converter to EMI

被引：0

作者：

Musumeci, Domenico ^{[1
]}

Fiori, Franco ^{[2
]}

机构：

[1] Ist Super M Boella, EMC Competence Ctr, Via Boggio 56, Turin, Italy

[2] Politecn Torino, Microelect ENC Grp, Eln Dpt, Turin, Italy

来源：

2009 20TH INTERNATIONAL ZURICH SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY | 2009年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper discusses the susceptibility of Sigma-Delta Analog-to-Digital converters to disturbances, arising from environmental electromagnetic pollution or from the parasitic coupling with noisy building blocks integrated in the same system-on-chip (SoC) or system-in-package (SiP). The operation of a first-order switched-capacitor sigma-delta converter, which receives at its input nominal signals corrupted by radio-frequency interference is analyzed through time domain computer simulations and the root causes of failures are discussed in detail.

引用

页码：305 / +

页数：2

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