Susceptibility of a Sigma-Delta Converter to EMI

被引:0
|
作者
Musumeci, Domenico [1 ]
Fiori, Franco [2 ]
机构
[1] Ist Super M Boella, EMC Competence Ctr, Via Boggio 56, Turin, Italy
[2] Politecn Torino, Microelect ENC Grp, Eln Dpt, Turin, Italy
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper discusses the susceptibility of Sigma-Delta Analog-to-Digital converters to disturbances, arising from environmental electromagnetic pollution or from the parasitic coupling with noisy building blocks integrated in the same system-on-chip (SoC) or system-in-package (SiP). The operation of a first-order switched-capacitor sigma-delta converter, which receives at its input nominal signals corrupted by radio-frequency interference is analyzed through time domain computer simulations and the root causes of failures are discussed in detail.
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页码:305 / +
页数:2
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