Novel activation process for Mg-implanted GaN

被引:9
|
作者
Hashimoto, Shin [1 ]
Nakamura, Takao [1 ]
Honda, Yoshio [2 ]
Amano, Hiroshi [2 ]
机构
[1] Sumitomo Elect Ind Ltd, Itami, Hyogo 6640016, Japan
[2] Nagoya Univ, Akasaki Res Ctr, Dept Elect Engn & Comp Sci, Nagoya, Aichi 4648603, Japan
关键词
Doping; Recrystallization; Migration enhanced epitaxy; Nitrides; Semiconducting gallium compounds; YELLOW LUMINESCENCE; GALLIUM VACANCIES; CARBON;
D O I
10.1016/j.jcrysgro.2013.07.011
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
A novel activation process for Mg-implanted GaN was demonstrated. As opposed to the conventional thermal annealing process, an H-2/NH3 alternating supply annealing process achieved better optical activation, stronger near-ullraviolel luminescence and weaker yellow luminescence in the phololuminescence spectroscopy. After this process, small hexagonal hillocks were observed on the surface, which indicated that crystal regrowth was induced by this process, consisting of decomposition of GaN by H-2 supplies and re-crystallization by NH3 supplies. It was revealed that the implanted Mg could easily be located at the activation site by means of crystal regrowth by this process. (C) 2013 Elsevier B.V. All rights reserved
引用
收藏
页码:112 / 115
页数:4
相关论文
共 50 条
  • [21] Thermal evolution of Implantation Damages in Mg-Implanted GaN layers grown on Si
    Lardeau-Falcy, A.
    Coig, M.
    Charles, M.
    Licitra, C.
    Kanyandekwe, J.
    Milesi, F.
    Eymery, J.
    Mazen, F.
    GALLIUM NITRIDE AND SILICON CARBIDE POWER TECHNOLOGIES 7, 2017, 80 (07): : 131 - 138
  • [22] Mg-implanted bevel edge termination structure for GaN power device applications
    Matys, Maciej
    Ishida, Takashi
    Nam, Kyung Pil
    Sakurai, Hideki
    Narita, Tetsuo
    Uesugi, Tsutomu
    Bockowski, Michal
    Suda, Jun
    Kachi, Tetsu
    APPLIED PHYSICS LETTERS, 2021, 118 (09)
  • [23] PHOTOLUMINESCENCE FROM MG-IMPLANTED GAAS
    YU, PW
    PARK, YS
    APPLIED PHYSICS LETTERS, 1977, 30 (01) : 14 - 16
  • [24] Athermal annealing of Mg-implanted GaAs
    Simonson, J
    Qadri, SB
    Rao, MV
    Fischer, R
    Grun, J
    Ridgway, MC
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2005, 81 (03): : 601 - 605
  • [25] A Study on the Performance of AlGaN/GaN HEMTs Regrown on Mg-Implanted GaN Layers With Low Channel Thickness
    Doering, Philipp
    Sinnwell, Matthias
    Mueller, Stefan
    Czap, Heiko
    Driad, Rachid
    Brueckner, Peter
    Koehler, Klaus
    Kirste, Lutz
    Mikulla, Michael
    Quay, Ruediger
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2023, 70 (03) : 947 - 952
  • [26] Strain Recovery and Defect Characterization in Mg-Implanted Homoepitaxial GaN on High-Quality GaN Substrates
    Wang, Yekan
    Huynh, Kenny
    Liao, Michael E.
    Yu, Hsuan-Ming
    Bai, Tingyu
    Tweedie, James
    Breckenridge, Mathew Hayden
    Collazo, Ramon
    Sitar, Zlatko
    Bockowski, Michal
    Liu, Yuzi
    Goorsky, Mark S.
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2020, 257 (04):
  • [27] Athermal annealing of Mg-implanted GaAs
    J. Simonson
    S.B. Qadri
    M.V. Rao
    R. Fischer
    J. Grun
    M.C. Ridgway
    Applied Physics A, 2005, 81 : 601 - 605
  • [28] Redistribution of Mg and H atoms in Mg-implanted GaN through ultra-high-pressure annealing
    Sakurai, Hideki
    Narita, Tetsuo
    Omori, Masato
    Yamada, Shinji
    Koura, Akihiko
    Iwinska, Malgorzata
    Kataoka, Keita
    Horita, Masahiro
    Ikarashi, Nobuyuki
    Bockowski, Michal
    Suda, Jun
    Kachi, Tetsu
    APPLIED PHYSICS EXPRESS, 2020, 13 (08)
  • [29] Property manipulation through pulsed laser annealing in high dose Mg-implanted GaN
    Shi, Ya-Ting
    Ren, Fang-Fang
    Hao, Jinggang
    Wang, Zhengpeng
    Ye, Jiandong
    Xu, Wei-Zong
    Zhou, Dong
    Zhang, Rong
    Zheng, Youdou
    Lu, Hai
    JOURNAL OF APPLIED PHYSICS, 2020, 128 (23)
  • [30] Vacancy-type defects in Mg-implanted GaN probed by a monoenergetic positron beam
    Uedono, Akira
    Takashima, Shinya
    Edo, Masaharu
    Ueno, Katsunori
    Matsuyama, Hideaki
    Kudo, Hiroshi
    Naramoto, Hiroshi
    Ishibashi, Shoji
    2016 16th International Workshop on Junction Technology (IWJT), 2016, : 35 - 38