Thickness-dependent optical properties of yttrium fluoride ultrathin films in the visible band

被引：1

作者：

Shan, Yao ^{[1
]}

Liu, Pian ^{[1
]}

Chen, Yao ^{[1
]}

Tu, Huatian ^{[1
]}

Zhang, Haotian ^{[1
]}

Zheng, Yuxiang ^{[1
]}

Zhang, Rongjun ^{[1
]}

Wang, Songyou ^{[1
]}

Chen, Liangyao ^{[1
]}

机构：

[1] Fudan Univ, Shanghai Engn Res Ctr Ultra Precis Opt Mfg, Key Lab Micro & Nano Photon Struct, Dept Opt Sci & Engn,Minist Educ, Shanghai 200433, Peoples R China

来源：

OPTICAL MATERIALS EXPRESS | 2020年 / 10卷 / 12期

基金：

中国国家自然科学基金;

关键词：

YF3; THIN-FILMS; SPECTROSCOPIC ELLIPSOMETRY; SCANNING ELLIPSOMETER; STRUCTURAL-PROPERTIES; VOID FRACTION; DEPOSITION; INTERFACE; POLARIZER; COATINGS; DESIGN;

D O I：

10.1364/OME.398536

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Yttrium fluoride (YF3) thin films with a thickness range of 10.8-1079.0 nm were prepared by electron beam evaporation. Spectroscopic ellipsometry was used to study the thickness-dependent optical properties of YF3 ultrathin films in the 300-820 nm wavelength range. With increasing thicknesses, the refractive indices of the intrinsic YF3 films increase slightly and approach that of bulk YF3 due to the decrease of void fractions. The effective refractive indices of the YF3 films also increase with increasing thicknesses, due to the surface and interface effects besides the contribution of decrease of void fractions. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

引用

页码：3306 / 3314

页数：9

共 50 条

[41] Thickness-dependent properties of ultrathin bismuth and antimony chalcogenide films formed by physical vapor deposition and their application in thermoelectric generators
Andzane, J.
Felsharuk, A.
Sarakovskis, A.
Malinovskis, U.
Kauranens, E.
Bechelany, M.
Niherysh, K. A.
Komissarov, I. V.
Erts, D.
[J]. MATERIALS TODAY ENERGY, 2021, 19
[42] Thickness-dependent properties of FeTaN thin films deposited on flexible substrate
Liu, Z.W.
Liu, Y.
Yan, L.
Tan, C.Y.
Ong, C.K.
[J]. Journal of Applied Physics, 1600, 99 (04):
[43] SURFACE-CHEMISTRY AND THICKNESS-DEPENDENT OPTICAL-PROPERTIES OF FILMS OF OXIDIZED NI/CR ON POLYIMIDE
DRAEGER, NA
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (06): : 2936 - 2940
[44] Thickness-dependent properties of FeTaN thin films deposited on flexible substrate
Liu, ZW
Liu, Y
Yan, L
Tan, CY
Ong, CK
[J]. JOURNAL OF APPLIED PHYSICS, 2006, 99 (04)
[45] Elastic and orbital effects on thickness-dependent properties of manganite thin films
Infante, I. C.
Sanchez, F.
Fontcuberta, J.
Wojcik, M.
Jedryka, E.
Estrade, S.
Peiro, F.
Arbiol, J.
Laukhin, V.
Espinos, J. P.
[J]. PHYSICAL REVIEW B, 2007, 76 (22)
[46] Thickness-dependent lattice relaxation and the associated optical properties of ZnO epitaxial films grown on Si (111)
Liu, W. -R.
Lin, B. H.
Kuo, C. C.
Lee, W. C.
Hong, M.
Kwo, J.
Hsu, C. -H.
Hsieh, W. F.
[J]. CRYSTENGCOMM, 2012, 14 (23): : 8103 - 8109
[47] Thickness-dependent electronic structure in ultrathin LaNiO3 films under tensile strain
Yoo, Hyang Keun
Hyun, Seung Ill
Chang, Young Jun
Moreschini, Luca
Sohn, Chang Hee
Kim, Hyeong-Do
Bostwick, Aaron
Rotenberg, Eli
Shim, Ji Hoon
Noh, Tae Won
[J]. PHYSICAL REVIEW B, 2016, 93 (03)
[48] Thickness-dependent thermoelectric properties of ultrathin polymer film on self-assembled monolayers
Chen, Xiaomin
Jin, Jiaoying
Sun, Shiyuan
Xiao, He
Wang, Lei
Liu, Danqing
[J]. APPLIED PHYSICS LETTERS, 2024, 124 (08)
[49] Thickness-dependent optical and structural properties of polytetrafluoroethylene/zinc oxide films by radio frequency magnetron sputtering
Tripathi, Shilpa
De, Rajnarayan
Rao, Kompalli D.
Haque, Sheikh M.
Goud, Bhujagouni K.
Prathap, Chillakala
Misal, Jitendra S.
Patidar, Manju M.
Ganesan, Vedachalaiyer
Sahoo, Naba K.
[J]. ADVANCES IN POLYMER TECHNOLOGY, 2018, 37 (08) : 2774 - 2787
[50] Thickness-dependent metal-insulator transition in epitaxial SrRuO3 ultrathin films
Shen, Xuan
Qiu, Xiangbiao
Su, Dong
Zhou, Shengqiang
Li, Aidong
Wu, Di
[J]. JOURNAL OF APPLIED PHYSICS, 2015, 117 (01)

← 1 2 3 4 5 →