PHOTOELECTROCHEMICAL CHARACTERISTICS OF BRUSH ELECTRODEPOSITED CdSexTe1-x THIN FILMS

CdSexTe1-x thin films were brush plated on titanium and conducting glass substrates from the precursors at different substrate temperatures in the range of 30 - 80 degrees C. X-ray diffraction studies indicated the films to possess hexagonal structure irrespective of composition. The strain and dislocation density decrease with increase of substrate temperature. The crystallite size increased from 30 - 100 nm as the substrate temperature increased. Optical band gap of the films varied in the range of 1.45 - 1.72 eV. Photoelectrochemical cells were made with the electrodes of different composition. The photo output was nearly equal to earlier reports.