The onset of quantization in ultra-submicron semiconductor devices

被引:72
|
作者
Ferry, DK [1 ]
机构
[1] Arizona State Univ, Nanostruct Res Grp, Tempe, AZ 85287 USA
[2] Arizona State Univ, Dept Elect Engn, Tempe, AZ 85287 USA
基金
美国国家科学基金会;
关键词
nanoelectronics; semiconductor devices; quantum effects; effective potential;
D O I
10.1006/spmi.1999.0800
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Within the next decade or so, it is expected that gate lengths will shrink to 50 nm or less in devices found in integrated circuits. At the same time, the thermal de Broglie wavelength for electrons in Si at 300 K is some 5 nm. How might we expect quantum mechanics to al ise in the transport through these small devices? Here,issues relevant for the quantum transport description of transport in ultra-small devices are discussed, such as the issue of quantum localization-just how small can the minimum-area be in which a single electron can be localized. After discussing such a minimum size, the-localization packet is associated with an 'effective' potential in which sharp discontinuities: are removed from the potential within the device. The replacement of sharp potentials :by smoothed potentials removes much of the driving force for quantization within these device structures. It will be shown that the introduction of such an effective potential:leads to an enhancement of the drain-induced barrier lowering in ultra-small devices, principally:in the 'on' state. (C) 2000 Academic Press.
引用
收藏
页码:61 / 66
页数:6
相关论文
共 50 条
  • [31] Semiconductor Membrane Photonic Devices for Ultra-low Power Consumption Operation
    Arai, Shigehisa
    Nishiyama, Nobuhiko
    Amemiya, Tomohiro
    Shindo, Takahiko
    Lee, Jieun
    Futami, Mitsuaki
    Doi, Kyohei
    Hiratani, Takuo
    [J]. 2013 IEEE PHOTONICS SOCIETY SUMMER TOPICAL MEETING SERIES, 2013, : 48 - +
  • [32] SPACE QUANTIZATION IN SEMICONDUCTOR FILMS
    NEDOREZOV, SS
    [J]. SOVIET PHYSICS SOLID STATE,USSR, 1971, 12 (08): : 1814 - +
  • [33] Submicron semiconductor structure for microwave detection
    Asmontas, S
    Gradauskas, J
    Suziedelis, A
    Valusis, G
    [J]. MICROELECTRONIC ENGINEERING, 2000, 53 (1-4) : 553 - 556
  • [34] Hot electrons in submicron semiconductor films
    Gurevich, YG
    Logvinov, GN
    [J]. SURFACES, VACUUM, AND THEIR APPLICATIONS, 1996, (378): : 156 - 160
  • [35] Effects of heavy ion irradiation on ultra-deep-submicron partially-depleted SOI devices
    Wu, Weikang
    An Xia
    Tan Fei
    Feng Hui
    Chen, Yehua
    Liu, Jingjing
    Zhang Xing
    Huang Ru
    [J]. JOURNAL OF SEMICONDUCTORS, 2015, 36 (11)
  • [36] Effects of heavy ion irradiation on ultra-deep-submicron partially-depleted SOI devices
    武唯康
    安霞
    谭斐
    冯慧
    陈叶华
    刘静静
    张兴
    黄如
    [J]. Journal of Semiconductors, 2015, 36 (11) - 49
  • [37] Effects of heavy ion irradiation on ultra-deep-submicron partially-depleted SOI devices
    武唯康
    安霞
    谭斐
    冯慧
    陈叶华
    刘静静
    张兴
    黄如
    [J]. Journal of Semiconductors, 2015, (11) : 45 - 49
  • [38] SEMICONDUCTOR DEVICES
    PARKER, RP
    [J]. BRITISH JOURNAL OF RADIOLOGY, 1969, 42 (503): : 870 - &
  • [39] SEMICONDUCTOR DEVICES
    EARLY, JM
    [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1962, 50 (05): : 1006 - &
  • [40] Modeling failure modes for submicron devices
    McMahon, W
    Haggag, A
    Hess, K
    [J]. PROCEEDINGS OF THE 2001 8TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS, 2001, : 161 - 164